The changes in optical absorbance of ZrO2 thin film with the rise of the absorbed dose

D. Abayli; N. Baydogan

doi:10.1063/1.4944177

The changes in optical absorbance of ZrO₂ thin film with the rise of the absorbed dose

D. Abayli, N. Baydogan^*

^*Corresponding author for this work

Energy Institute

Istanbul Technical University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

In this study, zirconium oxide (ZrO₂) thin film samples prepared by sol-gel method were irradiated using Co-60 radioisotope as gamma source. Then, it was investigated the ionizing effect on optical properties of ZrO₂ thin film samples with the rise of the absorbed dose. The changes in the optical absorbance of ZrO₂ thin films were determined by using optical transmittance and the reflectance measurements in the range between 190 - 1100 nm obtained from PG Instruments T80 UV-Vis spectrophotometer.

Original language	English
Title of host publication	9th International Physics Conference of the Balkan Physical Union, BPU 2015
Editors	Baki Akkus, Gulfem Susoy Dogan, R. Burcu Cakirli Mutlu, Latife Sahin Yalcin, Yesim Oktem
Publisher	American Institute of Physics Inc.
ISBN (Electronic)	9780735413696
DOIs	https://doi.org/10.1063/1.4944177
Publication status	Published - 25 Mar 2016
Event	9th International Physics Conference of the Balkan Physical Union, BPU 2015 - Istanbul, Turkey Duration: 24 Aug 2015 → 27 Aug 2015

Publication series

Name	AIP Conference Proceedings
Volume	1722
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	9th International Physics Conference of the Balkan Physical Union, BPU 2015
Country/Territory	Turkey
City	Istanbul
Period	24/08/15 → 27/08/15

Bibliographical note

Publisher Copyright:
© 2016 AIP Publishing LLC.

Access to Document

10.1063/1.4944177

Cite this

Abayli, D., & Baydogan, N. (2016). The changes in optical absorbance of ZrO₂ thin film with the rise of the absorbed dose. In B. Akkus, G. S. Dogan, R. B. C. Mutlu, L. S. Yalcin, & Y. Oktem (Eds.), 9th International Physics Conference of the Balkan Physical Union, BPU 2015 Article 090001 (AIP Conference Proceedings; Vol. 1722). American Institute of Physics Inc.. https://doi.org/10.1063/1.4944177

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abstract = "In this study, zirconium oxide (ZrO2) thin film samples prepared by sol-gel method were irradiated using Co-60 radioisotope as gamma source. Then, it was investigated the ionizing effect on optical properties of ZrO2 thin film samples with the rise of the absorbed dose. The changes in the optical absorbance of ZrO2 thin films were determined by using optical transmittance and the reflectance measurements in the range between 190 - 1100 nm obtained from PG Instruments T80 UV-Vis spectrophotometer.",

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Abayli, D & Baydogan, N 2016, The changes in optical absorbance of ZrO₂ thin film with the rise of the absorbed dose. in B Akkus, GS Dogan, RBC Mutlu, LS Yalcin & Y Oktem (eds), 9th International Physics Conference of the Balkan Physical Union, BPU 2015., 090001, AIP Conference Proceedings, vol. 1722, American Institute of Physics Inc., 9th International Physics Conference of the Balkan Physical Union, BPU 2015, Istanbul, Turkey, 24/08/15. https://doi.org/10.1063/1.4944177

The changes in optical absorbance of ZrO₂ thin film with the rise of the absorbed dose. / Abayli, D.; Baydogan, N.
9th International Physics Conference of the Balkan Physical Union, BPU 2015. ed. / Baki Akkus; Gulfem Susoy Dogan; R. Burcu Cakirli Mutlu; Latife Sahin Yalcin; Yesim Oktem. American Institute of Physics Inc., 2016. 090001 (AIP Conference Proceedings; Vol. 1722).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - In this study, zirconium oxide (ZrO2) thin film samples prepared by sol-gel method were irradiated using Co-60 radioisotope as gamma source. Then, it was investigated the ionizing effect on optical properties of ZrO2 thin film samples with the rise of the absorbed dose. The changes in the optical absorbance of ZrO2 thin films were determined by using optical transmittance and the reflectance measurements in the range between 190 - 1100 nm obtained from PG Instruments T80 UV-Vis spectrophotometer.

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