TEK KAPI SÜRÜCÜLÜ 1200V SERİ BAǦLI GAN-IGBT HİBRİT ANAHTAR

Translated title of the contribution: 1200V Series-Connected GAN-IGBT Hybrid Switch with Single Gate Driver

Omer Faruk Goksu, Mehmet Onur Gulbahce, Serkan Dusmez

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

GaN FETs offer higher switching speeds and lower gate drive losses compared to IGBTs. Their low parasitic capacitance allows for achieving higher switching frequencies. Due to the limited Vds voltage of GaN FETs, they must be connected in series for high-voltage power conversion applications, necessitating voltage balancing. This study proposes a gate driving scheme and circuitry to control an 800V / 16A hybrid switch using a single gate driver while balancing voltage across the series-connected GaN FETs. As a result of using the hybrid configuration, conduction loss on GaN FETs has been reduced by 70.7%, and the cost of the switching unit has decreased significantly, making it an alternative low-switching loss and high power switching unit.

Translated title of the contribution1200V Series-Connected GAN-IGBT Hybrid Switch with Single Gate Driver
Original languageTurkish
Title of host publicationElectrical-Electronics and Biomedical Engineering Conference, ELECO 2024 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331518035
DOIs
Publication statusPublished - 2024
Event2024 Electrical, Electronics and Biomedical Engineering Conference at 15th National Conference on Electrical and Electronics Engineering, ELECO 2024 - Bursa, Turkey
Duration: 28 Nov 202430 Nov 2024

Publication series

NameElectrical-Electronics and Biomedical Engineering Conference, ELECO 2024 - Proceedings

Conference

Conference2024 Electrical, Electronics and Biomedical Engineering Conference at 15th National Conference on Electrical and Electronics Engineering, ELECO 2024
Country/TerritoryTurkey
CityBursa
Period28/11/2430/11/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

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