Abstract
In this study, we perform a physical-information-theoretic analysis to obtain fundamental energy dissipation bounds for fault-tolerant reversible CMOS circuits we synthesize using Hamming codes. We show that the approach we had initially developed to calculate theoretical efficiency limitations of emerging electronic paradigms can also be applied to CMOS technology base and can provide feedback to improve circuit design and performance. We illustrate our physical-information-theoretic methodology via applications to circuits that we synthesized using Hamming codes that result in detection of up to (d-1) bit errors and correction of up to (d-1)/2 bit errors where d represents the minimum Hamming distance between any pair of bit patterns. The fundamental lower bounds on energy dissipation are calculated for a one-bit reversible full adder and for irreversible full adders with block-code-, dual modular redundancy (DMR)- and triple modular redundancy (TMR)-based CMOS circuits. Our results reflect the fundamental difference in energy limitations across these circuits and provide insights into improved design strategies.
Original language | English |
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Title of host publication | SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781509050529 |
DOIs | |
Publication status | Published - 14 Jul 2017 |
Event | 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017 - Giardini Naxos, Taormina, Italy Duration: 12 Jun 2017 → 15 Jun 2017 |
Publication series
Name | SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design |
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Conference
Conference | 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017 |
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Country/Territory | Italy |
City | Giardini Naxos, Taormina |
Period | 12/06/17 → 15/06/17 |
Bibliographical note
Publisher Copyright:© 2017 IEEE.
Keywords
- error detection and correction
- fault tolerance
- Fundamental energy bounds
- reversible circuits