Superresolution in scanning fluorescence microscopy by means of image processing in the optical domain

U. Brand*, J. Grochmalicki, G. Hester, I. Akduman, Edward R.M.D. Pike

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present a new technique in scanning fluorescence microscopy with high-NA lenses that offers improved resolution over confocal imaging modes by employing new optical masks. The pattern of this 2D element, which both reflects and transmits the light in the final image plane into subsequent detectors, is calculated by a singular value decomposition of the imaging operator. It brings about instant optical processing to extend the effective bandwidth of the transfer function clearly beyond that of the confocal microscope and leads to a resolution enhancement of up to 50%. We describe the development of the mask along with theoretical results.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages216-227
Number of pages12
DOIs
Publication statusPublished - 1996
Externally publishedYes
EventOptical Biopsies and Microscopic Techniques - Vienna, Austria
Duration: 7 Sept 19967 Sept 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2926
ISSN (Print)0277-786X

Conference

ConferenceOptical Biopsies and Microscopic Techniques
CityVienna, Austria
Period7/09/967/09/96

Fingerprint

Dive into the research topics of 'Superresolution in scanning fluorescence microscopy by means of image processing in the optical domain'. Together they form a unique fingerprint.

Cite this