Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Mehrdad Atabak, Özhan Ünverdi, H. Özgür Özer, Ahmet Oral*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

We report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 × 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been observed to be 2.5 N/m at single atomic step, in contrast to 13 N/m at multi atomic step on Si(1 1 1) surface. We also carried out a series of lateral stiffness-distance spectroscopy. We observed lateral stiffness-distance curves exhibit sharp increase in the stiffness as the sample is approached towards the surface. We usually observed positive stiffness and sometimes going into slightly negative region.

Original languageEnglish
Pages (from-to)1299-1303
Number of pages5
JournalApplied Surface Science
Volume256
Issue number5
DOIs
Publication statusPublished - 15 Dec 2009

Keywords

  • Lateral force gradient-distance spectroscopy
  • Non-contact lateral atomic force microscopy
  • Small oscillation amplitude

Fingerprint

Dive into the research topics of 'Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement'. Together they form a unique fingerprint.

Cite this