Spin resolved imaging with scanning field-emission microscopy

U. Ramsperger; L. G. De Pietro; G. Bertolini; H. Cabrera; J. Zhou; O. Gurlu; A. Vindigni; D. Pescia

doi:10.1109/IVNC.2018.8520178

Spin resolved imaging with scanning field-emission microscopy

U. Ramsperger, L. G. De Pietro, G. Bertolini, H. Cabrera, J. Zhou, O. Gurlu, A. Vindigni, D. Pescia

Swiss Federal Institute of Technology Zurich

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.

Original language	English
Title of host publication	2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538657171
DOIs	https://doi.org/10.1109/IVNC.2018.8520178
Publication status	Published - 1 Nov 2018
Externally published	Yes
Event	31st International Vacuum Nanoelectronics Conference, IVNC 2018 - Kyoto, Japan Duration: 9 Jul 2018 → 13 Jul 2018

Publication series

Name	2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018

Conference

Conference	31st International Vacuum Nanoelectronics Conference, IVNC 2018
Country/Territory	Japan
City	Kyoto
Period	9/07/18 → 13/07/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Funding

ACKNOWLEDGMENT We would like to thank T. Michlmayr, Y. Acremann, U. Maier and T. Bähler for technical assistance. We also thank the European Commission (SIMDALEE2: Marie Curie Initial Training Network (ITN), grant number 606988 under FP7-PEOPLE-2013-ITN), the Swiss National Science Foundation (SNF grant number 20-134422) and the Commission for Technology and Innovation (CTI grant number 9860.1 PFNM-NM) for financially supporting this work.

Funders	Funder number
Seventh Framework Programme	606988
European Commission	FP7-PEOPLE-2013-ITN
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung	20-134422
Kommission für Technologie und Innovation	9860.1 PFNM-NM

Keywords

Electron Microscopy
Field Emission
Magnetic Imaging
Secondary Electrons

Access to Document

10.1109/IVNC.2018.8520178

Cite this

Ramsperger, U., De Pietro, L. G., Bertolini, G., Cabrera, H., Zhou, J., Gurlu, O., Vindigni, A., & Pescia, D. (2018). Spin resolved imaging with scanning field-emission microscopy. In 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018 Article 8520178 (2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVNC.2018.8520178

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title = "Spin resolved imaging with scanning field-emission microscopy",

abstract = "Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15\% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.",

keywords = "Electron Microscopy, Field Emission, Magnetic Imaging, Secondary Electrons",

author = "U. Ramsperger and \{De Pietro\}, \{L. G.\} and G. Bertolini and H. Cabrera and J. Zhou and O. Gurlu and A. Vindigni and D. Pescia",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 31st International Vacuum Nanoelectronics Conference, IVNC 2018 ; Conference date: 09-07-2018 Through 13-07-2018",

year = "2018",

month = nov,

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doi = "10.1109/IVNC.2018.8520178",

language = "English",

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Ramsperger, U, De Pietro, LG, Bertolini, G, Cabrera, H, Zhou, J, Gurlu, O, Vindigni, A & Pescia, D 2018, Spin resolved imaging with scanning field-emission microscopy. in 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018., 8520178, 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018, Institute of Electrical and Electronics Engineers Inc., 31st International Vacuum Nanoelectronics Conference, IVNC 2018, Kyoto, Japan, 9/07/18. https://doi.org/10.1109/IVNC.2018.8520178

Spin resolved imaging with scanning field-emission microscopy. / Ramsperger, U.; De Pietro, L. G.; Bertolini, G. et al.
2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. 8520178 (2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Spin resolved imaging with scanning field-emission microscopy

AU - Ramsperger, U.

AU - De Pietro, L. G.

AU - Bertolini, G.

AU - Cabrera, H.

AU - Zhou, J.

AU - Gurlu, O.

AU - Vindigni, A.

AU - Pescia, D.

PY - 2018/11/1

Y1 - 2018/11/1

N2 - Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.

AB - Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.

KW - Electron Microscopy

KW - Field Emission

KW - Magnetic Imaging

KW - Secondary Electrons

UR - https://www.scopus.com/pages/publications/85057436732

U2 - 10.1109/IVNC.2018.8520178

DO - 10.1109/IVNC.2018.8520178

M3 - Conference contribution

AN - SCOPUS:85057436732

T3 - 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018

BT - 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 31st International Vacuum Nanoelectronics Conference, IVNC 2018

Y2 - 9 July 2018 through 13 July 2018

ER -

Ramsperger U, De Pietro LG, Bertolini G, Cabrera H, Zhou J, Gurlu O et al. Spin resolved imaging with scanning field-emission microscopy. In 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. 8520178. (2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018). doi: 10.1109/IVNC.2018.8520178

Spin resolved imaging with scanning field-emission microscopy

Abstract

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Keywords

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