Abstract
Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.
Original language | English |
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Title of host publication | 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781538657171 |
DOIs | |
Publication status | Published - 1 Nov 2018 |
Externally published | Yes |
Event | 31st International Vacuum Nanoelectronics Conference, IVNC 2018 - Kyoto, Japan Duration: 9 Jul 2018 → 13 Jul 2018 |
Publication series
Name | 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018 |
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Conference
Conference | 31st International Vacuum Nanoelectronics Conference, IVNC 2018 |
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Country/Territory | Japan |
City | Kyoto |
Period | 9/07/18 → 13/07/18 |
Bibliographical note
Publisher Copyright:© 2018 IEEE.
Funding
ACKNOWLEDGMENT We would like to thank T. Michlmayr, Y. Acremann, U. Maier and T. Bähler for technical assistance. We also thank the European Commission (SIMDALEE2: Marie Curie Initial Training Network (ITN), grant number 606988 under FP7-PEOPLE-2013-ITN), the Swiss National Science Foundation (SNF grant number 20-134422) and the Commission for Technology and Innovation (CTI grant number 9860.1 PFNM-NM) for financially supporting this work.
Funders | Funder number |
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Seventh Framework Programme | 606988 |
European Commission | FP7-PEOPLE-2013-ITN |
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung | 20-134422 |
Kommission für Technologie und Innovation | 9860.1 PFNM-NM |
Keywords
- Electron Microscopy
- Field Emission
- Magnetic Imaging
- Secondary Electrons