Spin resolved imaging with scanning field-emission microscopy

U. Ramsperger, L. G. De Pietro, G. Bertolini, H. Cabrera, J. Zhou, O. Gurlu, A. Vindigni, D. Pescia

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.

Original languageEnglish
Title of host publication2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538657171
DOIs
Publication statusPublished - 1 Nov 2018
Externally publishedYes
Event31st International Vacuum Nanoelectronics Conference, IVNC 2018 - Kyoto, Japan
Duration: 9 Jul 201813 Jul 2018

Publication series

Name2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018

Conference

Conference31st International Vacuum Nanoelectronics Conference, IVNC 2018
Country/TerritoryJapan
CityKyoto
Period9/07/1813/07/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Funding

ACKNOWLEDGMENT We would like to thank T. Michlmayr, Y. Acremann, U. Maier and T. Bähler for technical assistance. We also thank the European Commission (SIMDALEE2: Marie Curie Initial Training Network (ITN), grant number 606988 under FP7-PEOPLE-2013-ITN), the Swiss National Science Foundation (SNF grant number 20-134422) and the Commission for Technology and Innovation (CTI grant number 9860.1 PFNM-NM) for financially supporting this work.

FundersFunder number
Seventh Framework Programme606988
European CommissionFP7-PEOPLE-2013-ITN
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung20-134422
Kommission für Technologie und Innovation9860.1 PFNM-NM

    Keywords

    • Electron Microscopy
    • Field Emission
    • Magnetic Imaging
    • Secondary Electrons

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