Single Event Upset Tolerant TRNG Design and Its Tests under Radiation

Ozgur Ozan Yilmaz*, Melahat Bilge Demirkoz, Mustak Erhan Yalcin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The effect of space radiation on deterministic electronic circuits is a well researched topic. However, the statistical quality of non-deterministic numbers generated by True Random Number Generator (TRNG) circuits, critical for secure communication in space applications, has not been extensively explored in literature. This paper presents implementation of a resourceoptimized Mixed Mode Clock Manager (MMCM) based TRNG circuit on Xilinx Field Programmable Gate Arrays (FPGA), along with the results of statistical tests. The advantage of this study is the execution of Single Event Effects (SEE) tests, enabling a detailed examination of the TRNG circuit's performance under space radiation. Additionally, based on SEE test results, the TRNG circuit is redesigned using the fault tolerant design techniques. The performance of the applied fault tolerant design technique on the TRNG circuit is examined through a repetition of SEE tests.

Original languageEnglish
Title of host publication2024 39th Conference on Design of Circuits and Integrated Systems, DCIS 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350364392
DOIs
Publication statusPublished - 2024
Event39th Conference on Design of Circuits and Integrated Systems, DCIS 2024 - Catania, Italy
Duration: 13 Nov 202415 Nov 2024

Publication series

Name2024 39th Conference on Design of Circuits and Integrated Systems, DCIS 2024

Conference

Conference39th Conference on Design of Circuits and Integrated Systems, DCIS 2024
Country/TerritoryItaly
CityCatania
Period13/11/2415/11/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • Entropy
  • Fault Tolerant Design
  • Field Programmable Gate Arrays (FPGA)
  • Metastability
  • Single Event Effects (SEE)
  • Single Event Upset (SEU)
  • Space Radiation
  • Triple Modular Redundancy (TMR)
  • True Random Number Generator (TRNG)

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