Abstract
The effect of space radiation on deterministic electronic circuits is a well researched topic. However, the statistical quality of non-deterministic numbers generated by True Random Number Generator (TRNG) circuits, critical for secure communication in space applications, has not been extensively explored in literature. This paper presents implementation of a resourceoptimized Mixed Mode Clock Manager (MMCM) based TRNG circuit on Xilinx Field Programmable Gate Arrays (FPGA), along with the results of statistical tests. The advantage of this study is the execution of Single Event Effects (SEE) tests, enabling a detailed examination of the TRNG circuit's performance under space radiation. Additionally, based on SEE test results, the TRNG circuit is redesigned using the fault tolerant design techniques. The performance of the applied fault tolerant design technique on the TRNG circuit is examined through a repetition of SEE tests.
Original language | English |
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Title of host publication | 2024 39th Conference on Design of Circuits and Integrated Systems, DCIS 2024 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9798350364392 |
DOIs | |
Publication status | Published - 2024 |
Event | 39th Conference on Design of Circuits and Integrated Systems, DCIS 2024 - Catania, Italy Duration: 13 Nov 2024 → 15 Nov 2024 |
Publication series
Name | 2024 39th Conference on Design of Circuits and Integrated Systems, DCIS 2024 |
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Conference
Conference | 39th Conference on Design of Circuits and Integrated Systems, DCIS 2024 |
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Country/Territory | Italy |
City | Catania |
Period | 13/11/24 → 15/11/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- Entropy
- Fault Tolerant Design
- Field Programmable Gate Arrays (FPGA)
- Metastability
- Single Event Effects (SEE)
- Single Event Upset (SEU)
- Space Radiation
- Triple Modular Redundancy (TMR)
- True Random Number Generator (TRNG)