Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

H. Özgür Özer, Mehrdad Atabak, Recai M. Ellialtǧlu, Ahmet Oral*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

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Engineering

Material Science

Physics

Chemical Engineering