Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

H. Özgür Özer; Mehrdad Atabak; Recai M. Ellialtǧlu; Ahmet Oral

doi:10.1016/S0169-4332(01)00942-4

Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

H. Özgür Özer, Mehrdad Atabak, Recai M. Ellialtǧlu, Ahmet Oral^*

^*Corresponding author for this work

Bilkent University

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.

Original language	English
Pages (from-to)	301-305
Number of pages	5
Journal	Applied Surface Science
Volume	188
Issue number	3-4
DOIs	https://doi.org/10.1016/S0169-4332(01)00942-4
Publication status	Published - 28 Mar 2002
Externally published	Yes

Funding

This project is partially supported by British Council and NanoMagnetics Instruments Ltd.

Funders	Funder number
NanoMagnetics Instruments Ltd
British Council

Keywords

Force-distance spectroscopy
Non-contact atomic force microscopy
Short-range forces
Si(1 0 0)(2 × 1)
Small oscillation amplitudes

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10.1016/S0169-4332(01)00942-4

Cite this

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title = "Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes",

abstract = "Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-{\AA}ngstr{\"o}m oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.",

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year = "2002",

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doi = "10.1016/S0169-4332(01)00942-4",

language = "English",

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journal = "Applied Surface Science",

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T1 - Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

AU - Özer, H. Özgür

AU - Atabak, Mehrdad

AU - Ellialtǧlu, Recai M.

AU - Oral, Ahmet

PY - 2002/3/28

Y1 - 2002/3/28

N2 - Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.

AB - Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.

KW - Force-distance spectroscopy

KW - Non-contact atomic force microscopy

KW - Short-range forces

KW - Si(1 0 0)(2 × 1)

KW - Small oscillation amplitudes

UR - https://www.scopus.com/pages/publications/0037187204

U2 - 10.1016/S0169-4332(01)00942-4

DO - 10.1016/S0169-4332(01)00942-4

M3 - Article

AN - SCOPUS:0037187204

SN - 0169-4332

VL - 188

SP - 301

EP - 305

JO - Applied Surface Science

JF - Applied Surface Science

IS - 3-4

ER -

Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

Abstract

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Keywords

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