Abstract
Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.
Original language | English |
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Pages (from-to) | 301-305 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 188 |
Issue number | 3-4 |
DOIs | |
Publication status | Published - 28 Mar 2002 |
Externally published | Yes |
Funding
This project is partially supported by British Council and NanoMagnetics Instruments Ltd.
Funders | Funder number |
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NanoMagnetics Instruments Ltd | |
British Council |
Keywords
- Force-distance spectroscopy
- Non-contact atomic force microscopy
- Short-range forces
- Si(1 0 0)(2 × 1)
- Small oscillation amplitudes