Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

H. Özgür Özer, Mehrdad Atabak, Recai M. Ellialtǧlu, Ahmet Oral*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.

Original languageEnglish
Pages (from-to)301-305
Number of pages5
JournalApplied Surface Science
Volume188
Issue number3-4
DOIs
Publication statusPublished - 28 Mar 2002
Externally publishedYes

Funding

This project is partially supported by British Council and NanoMagnetics Instruments Ltd.

FundersFunder number
NanoMagnetics Instruments Ltd
British Council

    Keywords

    • Force-distance spectroscopy
    • Non-contact atomic force microscopy
    • Short-range forces
    • Si(1 0 0)(2 × 1)
    • Small oscillation amplitudes

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