Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)

G. Bertolini; L. De Pietro; Th Bähler; H. Cabrera; O. Gürlü; D. Pescia; U. Ramsperger

doi:10.1016/j.elspec.2019.05.014

Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)

G. Bertolini, L. De Pietro, Th Bähler, H. Cabrera, O. Gürlü, D. Pescia, U. Ramsperger^*

^*Corresponding author for this work

Department of Physics Engineering

Swiss Federal Institute of Technology Zurich

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

In the Fowler-Nordheim regime of Scanning Tunneling Microscopy (STM) the tip-target distance is few nanometers to few tens of nanometers. In this situation the tunneling between tip and target is completely suppressed. Instead, electrons can be field-emitted from the tip and their impact with the target might excite electrons off the surface. Under certain circumstances, the excited electrons escape the tip-target junction and build a new electronic system, absent in the tunneling regime of STM. A recent experiment discovered that this electronic system is spin polarized at nanoscale tip-target distances. Here we provide a comprehensive review of all strategies that have been adopted to perform the spin polarized experiments in the Fowler-Nordheim regime of STM. We also present new data that complement the proof of spin polarization and specifically underline the magnetic imaging potential of this new technology, which we call Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA).

Original language	English
Article number	146865
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	241
DOIs	https://doi.org/10.1016/j.elspec.2019.05.014
Publication status	Published - May 2020

Bibliographical note

Publisher Copyright:
© 2019 The Authors

Funding

We thank Y. Acremann, U. Meier, T. Michlmayr for technical assistance and Mrs. Heidi Hostettler for the photographs in Fig. 1 . We thank C. Walker for critical reading of the manuscript. We also thank the European Commission (SIMDALEE2: Marie Curie Initial Training Network (ITN), Grant number 606988 under FP7-PEOPLE-2013-ITN), the Swiss National Science Foundation (SNF grant number 20-134422 ) and the Commission for Technology and Innovation (CTI grant number 9860.1 PFNM-NM ) for financing this work.

Funders	Funder number
Seventh Framework Programme	606988
European Commission	FP7-PEOPLE-2013-ITN
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung	20-134422
Kommission für Technologie und Innovation	9860.1 PFNM-NM

Keywords

Magnetic imaging
Scanning Electron Microscopy with Polarization Analysis
Scanning Field Emission Microscopy with Polarization Analysis
Scanning Tunnelling Microscopy

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10.1016/j.elspec.2019.05.014

Cite this

@article{338584ae6e8b45dba943fa61ce37eea8,

title = "Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)",

abstract = "In the Fowler-Nordheim regime of Scanning Tunneling Microscopy (STM) the tip-target distance is few nanometers to few tens of nanometers. In this situation the tunneling between tip and target is completely suppressed. Instead, electrons can be field-emitted from the tip and their impact with the target might excite electrons off the surface. Under certain circumstances, the excited electrons escape the tip-target junction and build a new electronic system, absent in the tunneling regime of STM. A recent experiment discovered that this electronic system is spin polarized at nanoscale tip-target distances. Here we provide a comprehensive review of all strategies that have been adopted to perform the spin polarized experiments in the Fowler-Nordheim regime of STM. We also present new data that complement the proof of spin polarization and specifically underline the magnetic imaging potential of this new technology, which we call Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA).",

keywords = "Magnetic imaging, Scanning Electron Microscopy with Polarization Analysis, Scanning Field Emission Microscopy with Polarization Analysis, Scanning Tunnelling Microscopy",

author = "G. Bertolini and \{De Pietro\}, L. and Th B{\"a}hler and H. Cabrera and O. G{\"u}rl{\"u} and D. Pescia and U. Ramsperger",

note = "Publisher Copyright: {\textcopyright} 2019 The Authors",

year = "2020",

month = may,

doi = "10.1016/j.elspec.2019.05.014",

language = "English",

volume = "241",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

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T1 - Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)

AU - Bertolini, G.

AU - De Pietro, L.

AU - Bähler, Th

AU - Cabrera, H.

AU - Gürlü, O.

AU - Pescia, D.

AU - Ramsperger, U.

PY - 2020/5

Y1 - 2020/5

N2 - In the Fowler-Nordheim regime of Scanning Tunneling Microscopy (STM) the tip-target distance is few nanometers to few tens of nanometers. In this situation the tunneling between tip and target is completely suppressed. Instead, electrons can be field-emitted from the tip and their impact with the target might excite electrons off the surface. Under certain circumstances, the excited electrons escape the tip-target junction and build a new electronic system, absent in the tunneling regime of STM. A recent experiment discovered that this electronic system is spin polarized at nanoscale tip-target distances. Here we provide a comprehensive review of all strategies that have been adopted to perform the spin polarized experiments in the Fowler-Nordheim regime of STM. We also present new data that complement the proof of spin polarization and specifically underline the magnetic imaging potential of this new technology, which we call Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA).

AB - In the Fowler-Nordheim regime of Scanning Tunneling Microscopy (STM) the tip-target distance is few nanometers to few tens of nanometers. In this situation the tunneling between tip and target is completely suppressed. Instead, electrons can be field-emitted from the tip and their impact with the target might excite electrons off the surface. Under certain circumstances, the excited electrons escape the tip-target junction and build a new electronic system, absent in the tunneling regime of STM. A recent experiment discovered that this electronic system is spin polarized at nanoscale tip-target distances. Here we provide a comprehensive review of all strategies that have been adopted to perform the spin polarized experiments in the Fowler-Nordheim regime of STM. We also present new data that complement the proof of spin polarization and specifically underline the magnetic imaging potential of this new technology, which we call Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA).

KW - Magnetic imaging

KW - Scanning Electron Microscopy with Polarization Analysis

KW - Scanning Field Emission Microscopy with Polarization Analysis

KW - Scanning Tunnelling Microscopy

UR - https://www.scopus.com/pages/publications/85067246661

U2 - 10.1016/j.elspec.2019.05.014

DO - 10.1016/j.elspec.2019.05.014

M3 - Article

AN - SCOPUS:85067246661

SN - 0368-2048

VL - 241

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

M1 - 146865

ER -

Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)

Abstract

Bibliographical note

Funding

Keywords

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