Robust High-Capacitance Polymer Gate Dielectrics for Stable Low-Voltage Organic Field-Effect Transistor Sensors

Aiman Rahmanudin*, Daniel J. Tate, Raymundo Marcial-Hernandez, Nicholas Bull, Suresh K. Garlapati, Adibah Zamhuri, Raja U. Khan, Sheida Faraji, Sankara R. Gollu, Krishna C. Persaud, Michael L. Turner

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

35 Citations (Scopus)

Abstract

Organic field-effect transistors (OFETs) have shown great promise for use as chemical sensors for applications that range from the monitoring of food spoilage to the determination of air quality and the diagnosis of disease. However, for these devices to be truly useful, they must deliver reliable and stable low-voltage operation over extended timescales. An important element to address this challenge is the development of a high-capacitance gate dielectric that delivers excellent insulation with robust chemical resistance against the solution processing of organic semiconductors (OSC). The development of a bilayer gate dielectric containing a high-k fluoropolymer relaxor ferroelectric layer modified at the OSC/dielectric interface with a photo-crosslinked chemically resistant low-k methacrylate-based copolymer buffer layer is reported. Bottom-gate OFET chemical sensors using this bilayer dielectric operate at low-voltage with exceptional operational stability. They deliver reliable sensing performance over multiple cycles of ammonia exposure (2 to 50 ppm) with an estimated limit-of-detection below 1 ppm.

Original languageEnglish
Article number1901127
JournalAdvanced Electronic Materials
Volume6
Issue number3
DOIs
Publication statusPublished - 1 Mar 2020
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2020 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Keywords

  • ammonia gas
  • chemical sensors
  • ferroelectric relaxor fluoropolymers
  • organic semiconductors
  • polymer crosslinking

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