Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Ahmet Oral; Ralph A. Grimble; H. Özgür Özer; Peter M. Hoffmann; John B. Pethica

doi:10.1063/1.1389785

Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Ahmet Oral^*
, Ralph A. Grimble
, H. Özgür Özer
, Peter M. Hoffmann
, John B. Pethica

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

38 Citations (Scopus)

Abstract

Quantitative force gradient images are obtained using a sub-angström amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale.

Original language	English
Pages (from-to)	1915-1917
Number of pages	3
Journal	Applied Physics Letters
Volume	79
Issue number	12
DOIs	https://doi.org/10.1063/1.1389785
Publication status	Published - 17 Sept 2001
Externally published	Yes

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10.1063/1.1389785

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title = "Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy",

abstract = "Quantitative force gradient images are obtained using a sub-angstr{\"o}m amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale.",

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year = "2001",

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doi = "10.1063/1.1389785",

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T1 - Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

AU - Oral, Ahmet

AU - Grimble, Ralph A.

AU - Özer, H. Özgür

AU - Hoffmann, Peter M.

AU - Pethica, John B.

PY - 2001/9/17

Y1 - 2001/9/17

N2 - Quantitative force gradient images are obtained using a sub-angström amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale.

AB - Quantitative force gradient images are obtained using a sub-angström amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale.

UR - https://www.scopus.com/pages/publications/0035903347

U2 - 10.1063/1.1389785

DO - 10.1063/1.1389785

M3 - Article

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VL - 79

SP - 1915

EP - 1917

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 12

ER -

Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Abstract

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