Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Ahmet Oral*, Ralph A. Grimble, H. Özgür Özer, Peter M. Hoffmann, John B. Pethica

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

38 Citations (Scopus)

Abstract

Quantitative force gradient images are obtained using a sub-angström amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale.

Original languageEnglish
Pages (from-to)1915-1917
Number of pages3
JournalApplied Physics Letters
Volume79
Issue number12
DOIs
Publication statusPublished - 17 Sept 2001
Externally publishedYes

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