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Prioritized MC/DC Framework for Early Fault Detection in Safety-Critical Software

  • ASELSAN Inc.
  • Istanbul Technical University
  • Middle East Technical University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Modified Condition/Decision Coverage (MC/DC) guarantees each written code block is effective in the final software product. A practical outcome of MC/DC validation is the increased verification time. When coverage is tested from top to bottom, faults may be detected late. This fact unintentionally adds resistance to project schedule. On the other hand, late fault-detection could be omitted by prioritizing test cases based on recently modified code blocks. Additionally, ordering covered code blocks based on their cyclomatic complexity, Halstead volume, coverage time, and function call frequency affects verification time. Time to First Fault Detection (TTFFD) and Average Percentage of Faults Detected (APFD) are commonly used fault detection metrics. As a result, the proposed study improves the APFD metric by 30% and the TTFFD metric by 70% in high complexity codebases. In contrast, prioritization does not seem to positively affect low complexity codebases according to the experimental results. Considering that safety-critical software ought to be complex, the proposed MC/DC prioritization framework has a practical benefit to ease the burden on the developers.

Original languageEnglish
Title of host publication2026 15th Mediterranean Conference on Embedded Computing, MECO 2026 - Proceedings
EditorsRadovan Stojanovic, Lech Jozwiak, Budimir Lutovac
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798319505712
DOIs
Publication statusPublished - 2026
Event15th Mediterranean Conference on Embedded Computing, MECO 2026 - Budva, Montenegro
Duration: 9 Jun 202615 Jun 2026

Publication series

Name2026 15th Mediterranean Conference on Embedded Computing, MECO 2026 - Proceedings

Conference

Conference15th Mediterranean Conference on Embedded Computing, MECO 2026
Country/TerritoryMontenegro
CityBudva
Period9/06/2615/06/26

Bibliographical note

Publisher Copyright:
© 2026 IEEE.

Keywords

  • APFD
  • coverage instrumentation
  • DO-178C
  • error injection
  • MC/DC
  • static analysis
  • test case prioritization
  • TTFFD

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