Skip to main navigation Skip to search Skip to main content

Passive film characterisation of duplex stainless steel using scanning Kelvin probe force microscopy in combination with electrochemical measurements

  • Cem Örnek*
  • , Christofer Leygraf
  • , Jinshan Pan
  • *Corresponding author for this work
  • KTH Royal Institute of Technology

Research output: Contribution to journalArticlepeer-review

61 Citations (Scopus)

Abstract

The characterisation of passive oxide films on heterogeneous microstructures is needed to assess local degradation (corrosion, cracking) in aggressive environments. The Volta potential is a surface-sensitive parameter which can be used to assess the surface nobility and hence passive films. In this work, it is shown that the Volta potential, measured on super duplex stainless steel by scanning Kelvin probe force microscopy, correlates with the electrochemical properties of the passive film, measured by electrochemical impedance spectroscopy and potentiodynamic polarisation. Natural oxidation by ageing in ambient air as well as artificial oxidation by immersion in concentrated nitric acid improved the nobility, both reflected by increased Volta potentials and electrochemical parameters. Passivation was associated with vanishing of the inherent Volta potential difference between the ferrite and austenite, thereby reducing the galvanic coupling and hence improving the corrosion resistance of the material. Hydrogen-passive film interactions, triggered by cathodic polarisation, however, largely increased the Volta potential difference between the phases, resulting in loss of electrochemical nobility, with the ferrite being more affected than the austenite. A correlative approach of using the Volta potential in conjunction with electrochemical data has been introduced to characterise the nobility of passive films in global and local scale.

Original languageEnglish
Article number8
Journalnpj Materials Degradation
Volume3
Issue number1
DOIs
Publication statusPublished - Dec 2019
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2019, The Author(s).

Fingerprint

Dive into the research topics of 'Passive film characterisation of duplex stainless steel using scanning Kelvin probe force microscopy in combination with electrochemical measurements'. Together they form a unique fingerprint.

Cite this