Outage probability of two-way full-duplex af relay systems over Nakagami-m fading channels

Asil Koç, Ibrahim Altunbaş, Abbas Yongaçoǧlu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Citations (Scopus)

Abstract

In this paper, performance of two-way full-duplex cooperative systems under residual loop-interference (LI) is analyzed in terms of outage probability over Nakagami-m fading channels. At the relay node of the proposed system, physical-layer-network-coding technique and variable-gain full-duplex amplify-and-forward relaying method are combined for two-way transmission. End-to-end signal-to-interference-plus-noise-ratio (SINR) expression is derived for different power transmissions at the source and relay nodes. New exact outage probability expression is obtained in a single-integral form by using cumulative distribution function of the end-to-end SINR. The analytical results are verified by Monte-Carlo simulations. We also provide lower-bound and asymptotic expressions in closed-form for the outage performance. It is shown that the outage performance of the system is enhanced as long as either the transmit power or the efficiency of LI cancellation process increases. We also observe that the outage probability converges to an error floor due to the residual LI component at the source and relay nodes.

Original languageEnglish
Title of host publication2016 IEEE 84th Vehicular Technology Conference, VTC Fall 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509017010
DOIs
Publication statusPublished - 2 Jul 2016
Event84th IEEE Vehicular Technology Conference, VTC Fall 2016 - Montreal, Canada
Duration: 18 Sept 201621 Sept 2016

Publication series

NameIEEE Vehicular Technology Conference
Volume0
ISSN (Print)1550-2252

Conference

Conference84th IEEE Vehicular Technology Conference, VTC Fall 2016
Country/TerritoryCanada
CityMontreal
Period18/09/1621/09/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

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