OFDMA Sistemlerde Rastgele Ikili Diyagramlar Ile Farkli Sayilarda Alt-taşiyici Atama

Translated title of the contribution: Different numbers of subcarrier allocation in OFDMA systems via random bipartite graphs

Bugra Engin, Ibrahim Altunbas, Semiha Tedik Basaran, Gunes Karabulut Kurt

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this study, the problem of optimum subcarrier allocation in different numbers to users in OFDMA systems is discussed. OFDMA systems can be modelled by random bipartite graphs in scope of graph theory. Optimum subcarrier allocation with fixed numbers can be done by using maximum matching algorithms with providing fairness between users. In this study, Multi-R2EHK algorithm which provides subcarrier allocation in different numbers is proposed in accordance with requirements of different users. The results obtained with proposed algorithm shows that optimum subcarrier allocation according to user needs can be done by sacrificing some amount of performance. Besides, maximum frequency diversity and fairness between users also are provided.

Translated title of the contributionDifferent numbers of subcarrier allocation in OFDMA systems via random bipartite graphs
Original languageTurkish
Title of host publication2015 23rd Signal Processing and Communications Applications Conference, SIU 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1082-1085
Number of pages4
ISBN (Electronic)9781467373869
DOIs
Publication statusPublished - 19 Jun 2015
Event2015 23rd Signal Processing and Communications Applications Conference, SIU 2015 - Malatya, Turkey
Duration: 16 May 201519 May 2015

Publication series

Name2015 23rd Signal Processing and Communications Applications Conference, SIU 2015 - Proceedings

Conference

Conference2015 23rd Signal Processing and Communications Applications Conference, SIU 2015
Country/TerritoryTurkey
CityMalatya
Period16/05/1519/05/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

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