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Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique
T. Srinivasan-Rao*, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, T. Tsang, L. Kowalski
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
15
Citations
(Scopus)