Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

T. Srinivasan-Rao; M. Amin; V. Castillo; D. M. Lazarus; D. Nikas; C. Ozben; Y. K. Semertzidis; A. Stillman; T. Tsang; L. Kowalski

doi:10.1103/PhysRevSTAB.5.042801

Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

T. Srinivasan-Rao^*, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, T. Tsang, L. Kowalski

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.

Original language	English
Article number	042801
Pages (from-to)	16-22
Number of pages	7
Journal	Physical Review Special Topics - Accelerators and Beams
Volume	5
Issue number	4
DOIs	https://doi.org/10.1103/PhysRevSTAB.5.042801
Publication status	Published - 2002
Externally published	Yes

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Srinivasan-Rao, T., Amin, M., Castillo, V., Lazarus, D. M., Nikas, D., Ozben, C., Semertzidis, Y. K., Stillman, A., Tsang, T., & Kowalski, L. (2002). Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique. Physical Review Special Topics - Accelerators and Beams, 5(4), 16-22. Article 042801. https://doi.org/10.1103/PhysRevSTAB.5.042801

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title = "Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique",

abstract = "A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.",

author = "T. Srinivasan-Rao and M. Amin and V. Castillo and Lazarus, {D. M.} and D. Nikas and C. Ozben and Semertzidis, {Y. K.} and A. Stillman and T. Tsang and L. Kowalski",

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doi = "10.1103/PhysRevSTAB.5.042801",

language = "English",

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Srinivasan-Rao, T, Amin, M, Castillo, V, Lazarus, DM, Nikas, D, Ozben, C, Semertzidis, YK, Stillman, A, Tsang, T & Kowalski, L 2002, 'Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique', Physical Review Special Topics - Accelerators and Beams, vol. 5, no. 4, 042801, pp. 16-22. https://doi.org/10.1103/PhysRevSTAB.5.042801

TY - JOUR

T1 - Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

AU - Srinivasan-Rao, T.

AU - Amin, M.

AU - Castillo, V.

AU - Lazarus, D. M.

AU - Nikas, D.

AU - Ozben, C.

AU - Semertzidis, Y. K.

AU - Stillman, A.

AU - Tsang, T.

AU - Kowalski, L.

PY - 2002

Y1 - 2002

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AB - A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.

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M1 - 042801

ER -

Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

Abstract

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