Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

T. Srinivasan-Rao*, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, T. Tsang, L. Kowalski

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.

Original languageEnglish
Article number042801
Pages (from-to)16-22
Number of pages7
JournalPhysical Review Special Topics - Accelerators and Beams
Volume5
Issue number4
DOIs
Publication statusPublished - 2002
Externally publishedYes

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