Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy

Mehrdad Atabak; Özhan Ünverdi; H. Özgür Özer; Ahmet Oral

doi:10.1116/1.3097857

Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy

Mehrdad Atabak^*, Özhan Ünverdi, H. Özgür Özer, Ahmet Oral

^*Corresponding author for this work

Department of Physics Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 Nm at a single atomic step, in contrast to 13 Nm at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface.

Original language	English
Pages (from-to)	1001-1005
Number of pages	5
Journal	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume	27
Issue number	2
DOIs	https://doi.org/10.1116/1.3097857
Publication status	Published - 2009

Funding

This project is funded in Turkey by TÜBITAK Grant No. TBAG-2329 and the European Union NANOMAN Grant. The authors would like to thank Mr. Muharrem Demir of NanoMagnetics Instruments Ltd. for the technical support. A.O. thanks the Turkish Academy of Sciences (TÜBA) for financial support.

Funders	Funder number
TÜBA
European Commission
Türkiye Bilimsel ve Teknolojik Araştirma Kurumu	TBAG-2329
Türkiye Bilimler Akademisi

Access to Document

10.1116/1.3097857

Cite this

@article{de9eae7562794597bb646d21177535c8,

title = "Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy",

abstract = "In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 Nm at a single atomic step, in contrast to 13 Nm at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface.",

author = "Mehrdad Atabak and {\"O}zhan {\"U}nverdi and {\"O}zer, {H. {\"O}zg{\"u}r} and Ahmet Oral",

year = "2009",

doi = "10.1116/1.3097857",

language = "English",

volume = "27",

pages = "1001--1005",

journal = "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures",

issn = "1071-1023",

publisher = "AVS Science and Technology Society",

number = "2",

}

Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy. / Atabak, Mehrdad; Ünverdi, Özhan; Özer, H. Özgür et al.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 27, No. 2, 2009, p. 1001-1005.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy

AU - Atabak, Mehrdad

AU - Ünverdi, Özhan

AU - Özer, H. Özgür

AU - Oral, Ahmet

PY - 2009

Y1 - 2009

N2 - In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 Nm at a single atomic step, in contrast to 13 Nm at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface.

AB - In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 Nm at a single atomic step, in contrast to 13 Nm at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface.

UR - http://www.scopus.com/inward/record.url?scp=64549094277&partnerID=8YFLogxK

U2 - 10.1116/1.3097857

DO - 10.1116/1.3097857

M3 - Article

AN - SCOPUS:64549094277

SN - 1071-1023

VL - 27

SP - 1001

EP - 1005

JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

IS - 2

ER -

Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy

Abstract

Funding

Access to Document

Other files and links

Fingerprint

Cite this