Multiparameter imaging and understanding the role of the tip - Atomic resolution images of rutile TiO 2(110)

S. J. O'Brien*, H. Ozgur Ozer, G. L.W. Cross, J. B. Pethica

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A major challenge for scanned probe microscopy is to identify structures and chemical species on a surface, which have not already been inferred from other analytical techniques. Progress is impeded by the fact that in general the structure and composition of the tip atom is not known. To illustrate some of the issues involved, we report simultaneous scanning tunneling microscopy/atomic force microscopy (STM/AFM) of the TiO 2 (110) surface. The use of small amplitudes enabled the simultaneous acquisition of force gradient and barrier height images during standard STM imaging. Surprisingly, we find most STM images exhibit a corrugation contrast inverse to that usually reported in the literature. However, regardless of the contrast in STM, force gradient images always showed greater attraction over O rows. Barrier height images also show this consistency, always being greater over O rows. This supports the theoretical model of the electronic structure of the surface, but shows that the tip structure and interaction cannot be ignored in modeling STM images. We conclude that there is a fine balance between topography and local density of states (LDOS) in STM imaging of this surface; which of them dominates the STM image is determined by the tip. Simultaneous multi-parameter imaging is useful in interpreting images reliably, particularly on multi-component surfaces.

Original languageEnglish
Title of host publicationAdvances in Spectroscopy and Imaging of Surfaces and Nanostructures
Pages127-135
Number of pages9
DOIs
Publication statusPublished - 2011
Event2010 MRS Fall Meeting - Boston, MA, United States
Duration: 29 Nov 20103 Dec 2010

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1318
ISSN (Print)0272-9172

Conference

Conference2010 MRS Fall Meeting
Country/TerritoryUnited States
CityBoston, MA
Period29/11/103/12/10

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