MFR 2021: Masked Face Recognition Competition

Fadi Boutros, Naser Damer, Jan Niklas Kolf, Kiran Raja, Florian Kirchbuchner, Raghavendra Ramachandra, Arjan Kuijper, Pengcheng Fang, Chao Zhang, Fei Wang, David Montero, Naiara Aginako, Basilio Sierra, Marcos Nieto, Mustafa Ekrem Erakin, Ugur Demir, Hazim Kemal Ekenel, Asaki Kataoka, Kohei Ichikawa, Shizuma KuboJie Zhang, Mingjie He, Dan Han, Shiguang Shan, Klemen Grm, Vitomir Struc, Sachith Seneviratne, Nuran Kasthuriarachchi, Sanka Rasnayaka, Pedro C. Neto, Ana F. Sequeira, Joao Ribeiro Pinto, Mohsen Saffari, Jaime S. Cardoso

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

57 Citations (Scopus)

Abstract

This paper presents a summary of the Masked Face Recognition Competitions (MFR) held within the 2021 International Joint Conference on Biometrics (IJCB 2021). The competition attracted a total of 10 participating teams with valid submissions. The affiliations of these teams are diverse and associated with academia and industry in nine different countries. These teams successfully submitted 18 valid solutions. The competition is designed to motivate solutions aiming at enhancing the face recognition accuracy of masked faces. Moreover, the competition considered the deployability of the proposed solutions by taking the compactness of the face recognition models into account. A private dataset representing a collaborative, multisession, real masked, capture scenario is used to evaluate the submitted solutions. In comparison to one of the topperforming academic face recognition solutions, 10 out of the 18 submitted solutions did score higher masked face verification accuracy.

Original languageEnglish
Title of host publication2021 IEEE International Joint Conference on Biometrics, IJCB 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665437806
DOIs
Publication statusPublished - 4 Aug 2021
Externally publishedYes
Event2021 IEEE International Joint Conference on Biometrics, IJCB 2021 - Shenzhen, China
Duration: 4 Aug 20217 Aug 2021

Publication series

Name2021 IEEE International Joint Conference on Biometrics, IJCB 2021

Conference

Conference2021 IEEE International Joint Conference on Biometrics, IJCB 2021
Country/TerritoryChina
CityShenzhen
Period4/08/217/08/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

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