Measurement of energy dissipation between tungsten tip and Si(1 0 0)-( 2 × 1 ) using sub-Ångström oscillation amplitude non-contact atomic force microscope

H. Özgür Özer*, Mehrdad Atabak, Ahmet Oral

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 × 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Ångström oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat.

Original languageEnglish
Pages (from-to)12-17
Number of pages6
JournalApplied Surface Science
Volume210
Issue number1-2 SPEC.
DOIs
Publication statusPublished - 31 Mar 2003
Externally publishedYes

Funding

This project is partially supported by Bilkent University, British Council and Nanomagnetics Instruments Ltd.

FundersFunder number
NanoMagnetics Instruments Ltd
British Council
Bilkent Üniversitesi

    Keywords

    • Atomic scale dissipation
    • Dissipation-distance spectroscopy
    • Force-distance spectroscopy
    • Non-contact atomic force microscopy
    • Short-range forces
    • Si(1 0 0)-( 2 × 1 )
    • Small oscillation amplitudes

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