Abstract
Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 × 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Ångström oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat.
Original language | English |
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Pages (from-to) | 12-17 |
Number of pages | 6 |
Journal | Applied Surface Science |
Volume | 210 |
Issue number | 1-2 SPEC. |
DOIs | |
Publication status | Published - 31 Mar 2003 |
Externally published | Yes |
Funding
This project is partially supported by Bilkent University, British Council and Nanomagnetics Instruments Ltd.
Funders | Funder number |
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NanoMagnetics Instruments Ltd | |
British Council | |
Bilkent Üniversitesi |
Keywords
- Atomic scale dissipation
- Dissipation-distance spectroscopy
- Force-distance spectroscopy
- Non-contact atomic force microscopy
- Short-range forces
- Si(1 0 0)-( 2 × 1 )
- Small oscillation amplitudes