Machine Learning-Based Modeling of Hot Carrier Injection in 40 nm CMOS Transistors

Keyphrases

• Actual Measurement 50%
• Channel Geometry 100%
• CMOS Transistor 100%
• Conductance 50%
• Degradation Estimation 50%
• Degradation Modeling 50%
• Drain-source Current 50%
• Gaussian Process Regression 50%
• Hot Carrier Injection 100%
• Machine Learning Modeling 100%
• Machine Learning Models 50%
• Machine Learning-based Approach 50%
• Measure Data 50%
• MOSFET 100%
• Post-stress 50%
• Regression Algorithm 50%
• Statistical Measures 50%
• Stress Characteristics 50%
• Stress Conditions 100%
• Stress Measurement 50%
• Threshold Voltage 50%
• Transistor 50%

Engineering

• Channel Geometry 66%
• Current Source 33%
• Gaussians 33%
• Hot Carrier Injection 100%
• Learning System 100%
• Measurement Data 33%
• Metal-Oxide-Semiconductor Field-Effect Transistor 66%
• Metrics 33%
• Stress Condition 66%
• Test Data 33%

Material Science

• Hot Carrier Injection 100%
• Metal-Oxide-Semiconductor Field-Effect Transistor 100%
• Stress Measurement 50%
• Transistor 100%