Linear measurements of nanomechanical phenomena using small-amplitude AFM

Peter M. Hoffmann; Shivprasad Patil; George Matei; Atay Tanulku; Ralph Grimble; Özgur Özer; Steve Jeffery; Ahmet Oral; John Pethica

doi:10.1557/proc-838-o1.8

Linear measurements of nanomechanical phenomena using small-amplitude AFM

Peter M. Hoffmann^*, Shivprasad Patil, George Matei, Atay Tanulku, Ralph Grimble, Özgur Özer, Steve Jeffery, Ahmet Oral, John Pethica

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.

Original language	English
Title of host publication	Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
Publisher	Materials Research Society
Pages	7-12
Number of pages	6
ISBN (Print)	1558997865, 9781558997868
DOIs	https://doi.org/10.1557/proc-838-o1.8
Publication status	Published - 2004
Externally published	Yes
Event	2004 MRS Fall Meeting - Boston, MA, United States Duration: 29 Nov 2004 → 3 Dec 2004

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	838
ISSN (Print)	0272-9172

Conference

Conference	2004 MRS Fall Meeting
Country/Territory	United States
City	Boston, MA
Period	29/11/04 → 3/12/04

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Hoffmann, P. M., Patil, S., Matei, G., Tanulku, A., Grimble, R., Özer, Ö., Jeffery, S., Oral, A., & Pethica, J. (2004). Linear measurements of nanomechanical phenomena using small-amplitude AFM. In Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials (pp. 7-12). (Materials Research Society Symposium Proceedings; Vol. 838). Materials Research Society. https://doi.org/10.1557/proc-838-o1.8

@inproceedings{c928bfbf2e5242b287d352a2bfe67c69,

title = "Linear measurements of nanomechanical phenomena using small-amplitude AFM",

abstract = "Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.",

author = "Hoffmann, {Peter M.} and Shivprasad Patil and George Matei and Atay Tanulku and Ralph Grimble and {\"O}zgur {\"O}zer and Steve Jeffery and Ahmet Oral and John Pethica",

year = "2004",

doi = "10.1557/proc-838-o1.8",

language = "English",

isbn = "1558997865",

series = "Materials Research Society Symposium Proceedings",

publisher = "Materials Research Society",

pages = "7--12",

booktitle = "Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials",

note = "2004 MRS Fall Meeting ; Conference date: 29-11-2004 Through 03-12-2004",

}

Hoffmann, PM, Patil, S, Matei, G, Tanulku, A, Grimble, R, Özer, Ö, Jeffery, S, Oral, A & Pethica, J 2004, Linear measurements of nanomechanical phenomena using small-amplitude AFM. in Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials. Materials Research Society Symposium Proceedings, vol. 838, Materials Research Society, pp. 7-12, 2004 MRS Fall Meeting, Boston, MA, United States, 29/11/04. https://doi.org/10.1557/proc-838-o1.8

Linear measurements of nanomechanical phenomena using small-amplitude AFM. / Hoffmann, Peter M.; Patil, Shivprasad; Matei, George et al.
Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials. Materials Research Society, 2004. p. 7-12 (Materials Research Society Symposium Proceedings; Vol. 838).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Linear measurements of nanomechanical phenomena using small-amplitude AFM

AU - Hoffmann, Peter M.

AU - Patil, Shivprasad

AU - Matei, George

AU - Tanulku, Atay

AU - Grimble, Ralph

AU - Özer, Özgur

AU - Jeffery, Steve

AU - Oral, Ahmet

AU - Pethica, John

PY - 2004

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N2 - Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.

AB - Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.

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DO - 10.1557/proc-838-o1.8

M3 - Conference contribution

AN - SCOPUS:34249872470

SN - 1558997865

SN - 9781558997868

T3 - Materials Research Society Symposium Proceedings

SP - 7

EP - 12

BT - Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials

PB - Materials Research Society

T2 - 2004 MRS Fall Meeting

Y2 - 29 November 2004 through 3 December 2004

ER -

Linear measurements of nanomechanical phenomena using small-amplitude AFM

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