Abstract
A native passive film on 25Cr-7Ni super duplex stainless steel was analyzed using synchrotron hard X-ray photoemission electron microscopy, focusing on variations between individual grains of ferrite and austenite phases. The film consists of an oxide inner layer and an oxyhydroxide outer layer, in total 2.3 nm thick. The Cr content is higher in the outer than the inner layer, ca. 80 % on average. The Cr content is higher on ferrite than austenite, whereas the thickness is rather uniform. The grain orientation has a small but detectable influence, ferrite (111) grains have a lower Cr content than other ferrite grains.
| Original language | English |
|---|---|
| Article number | 108841 |
| Journal | Corrosion Science |
| Volume | 174 |
| DOIs | |
| Publication status | Published - Sept 2020 |
Bibliographical note
Publisher Copyright:© 2020 The Authors
Keywords
- duplex stainless steel
- lateral variation
- passive film
- photoelectron emission spectroscopy
- synchrotron technique
Fingerprint
Dive into the research topics of 'Lateral variation of the native passive film on super duplex stainless steel resolved by synchrotron hard X-ray photoelectron emission microscopy'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver