Investigation of the dielectric properties of newly synthesized and well defined low molecular weight macrophotoinitiator polystyrene thin film

Yunus Babur*, Ahmet Tumbul, Mustafa Degirmenci, I. H. Mutlu, E. Celik

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

In this study, powder PI-PSt-N3 polystyrene structure was synthesized by thin film spin coating method. To do this, 2 mg powder PI-PSt- N3 polystyrene with 0.5% loss of balance was mixed with chloroform for magnetic at an ambient temperature T = 23 °C for 18 hour (s). After coating, structural features the thin films were analyzed in an x-ray difractometer and dielectric electrical properties using a dielectric spectrometrer. The ellipsometer measurements of polystyrene films results show that the film thickness changed about 50 nm and 90 nm around and spectroscopic measurements of dielectric dielectric constant (ε ') have shown about 7.

Original languageEnglish
Pages (from-to)135-138
Number of pages4
JournalEnergy Education Science and Technology Part A: Energy Science and Research
Volume30
Issue numberSPEC .ISS.1
Publication statusPublished - Dec 2012
Externally publishedYes

Keywords

  • Dielectric
  • Impedance
  • Polystyrene
  • Thin film

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