Abstract
In this study, powder PI-PSt-N3 polystyrene structure was synthesized by thin film spin coating method. To do this, 2 mg powder PI-PSt- N3 polystyrene with 0.5% loss of balance was mixed with chloroform for magnetic at an ambient temperature T = 23 °C for 18 hour (s). After coating, structural features the thin films were analyzed in an x-ray difractometer and dielectric electrical properties using a dielectric spectrometrer. The ellipsometer measurements of polystyrene films results show that the film thickness changed about 50 nm and 90 nm around and spectroscopic measurements of dielectric dielectric constant (ε ') have shown about 7.
Original language | English |
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Pages (from-to) | 135-138 |
Number of pages | 4 |
Journal | Energy Education Science and Technology Part A: Energy Science and Research |
Volume | 30 |
Issue number | SPEC .ISS.1 |
Publication status | Published - Dec 2012 |
Externally published | Yes |
Keywords
- Dielectric
- Impedance
- Polystyrene
- Thin film