Abstract
The influence of lattice mismatch-induced tensile strain on the diffusion of Si dimers on Si(001) has been studied. The rate of surface diffusion of a Si dimer along the substrate dimer rows is relatively insensitive to tensile strain, whereas the rate of diffusion for a Si dimer across the substrate dimer rows is significantly enhanced. The insensitivity of the along row diffusion rate for tensile strain is attributed to the presence of a dissociative intermediate state of the ad-dimer during diffusion rather than diffusion as a solid unit.
| Original language | English |
|---|---|
| Pages (from-to) | 247-252 |
| Number of pages | 6 |
| Journal | Surface Science |
| Volume | 452 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 1 May 2000 |
| Externally published | Yes |
Funding
This work is supported by the Netherlands Organization for Scientific Research (NWO).
| Funders |
|---|
| Netherlands Organization for Scientific Research |
| Nederlandse Organisatie voor Wetenschappelijk Onderzoek |
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