Influence of strain on the diffusion of Si dimers on Si(001)

E. Zoethout*, O. Gürlü, H. J.W. Zandvliet, Bene Poelsema

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

Abstract

The influence of lattice mismatch-induced tensile strain on the diffusion of Si dimers on Si(001) has been studied. The rate of surface diffusion of a Si dimer along the substrate dimer rows is relatively insensitive to tensile strain, whereas the rate of diffusion for a Si dimer across the substrate dimer rows is significantly enhanced. The insensitivity of the along row diffusion rate for tensile strain is attributed to the presence of a dissociative intermediate state of the ad-dimer during diffusion rather than diffusion as a solid unit.

Original languageEnglish
Pages (from-to)247-252
Number of pages6
JournalSurface Science
Volume452
Issue number1-3
DOIs
Publication statusPublished - 1 May 2000
Externally publishedYes

Funding

This work is supported by the Netherlands Organization for Scientific Research (NWO).

FundersFunder number
Netherlands Organization for Scientific Research
Nederlandse Organisatie voor Wetenschappelijk Onderzoek

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