In situ synchrotron measurements of oxide growth strains

Jonathan D. Almer; Geoffrey A. Swift; John A. Nychka; Ersan Üstündag; David R. Clarke

doi:10.4028/0-87849-969-5.287

In situ synchrotron measurements of oxide growth strains

Jonathan D. Almer^*
, Geoffrey A. Swift
, John A. Nychka
, Ersan Üstündag
, David R. Clarke

^*Corresponding author for this work

United States Department of Energy
California Institute of Technology Division of Engineering and Applied Science
University of California

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Citations (Scopus)

Abstract

Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal Al FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (∼80keV) xrays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of-3.7 GPa.

Original language	English
Title of host publication	Residual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7
Publisher	Trans Tech Publications Ltd
Pages	287-293
Number of pages	7
ISBN (Print)	0878499695, 9780878499694
DOIs	https://doi.org/10.4028/0-87849-969-5.287
Publication status	Published - 2005
Externally published	Yes
Event	7th International Conference on Residual Stresses, ICRS-7 - Xi'an, China Duration: 14 Jun 2004 → 17 Jun 2004

Publication series

Name	Materials Science Forum
Volume	490-491
ISSN (Print)	0255-5476
ISSN (Electronic)	1662-9752

Conference

Conference	7th International Conference on Residual Stresses, ICRS-7
Country/Territory	China
City	Xi'an
Period	14/06/04 → 17/06/04

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10.4028/0-87849-969-5.287

Cite this

Almer, J. D., Swift, G. A., Nychka, J. A., Üstündag, E., & Clarke, D. R. (2005). In situ synchrotron measurements of oxide growth strains. In Residual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7 (pp. 287-293). (Materials Science Forum; Vol. 490-491). Trans Tech Publications Ltd. https://doi.org/10.4028/0-87849-969-5.287

@inproceedings{1c4a890a10b744428c4e86c3bcba54f5,

title = "In situ synchrotron measurements of oxide growth strains",

abstract = "Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal Al FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (∼80keV) xrays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of-3.7 GPa.",

author = "Almer, \{Jonathan D.\} and Swift, \{Geoffrey A.\} and Nychka, \{John A.\} and Ersan {\"U}st{\"u}ndag and Clarke, \{David R.\}",

year = "2005",

doi = "10.4028/0-87849-969-5.287",

language = "English",

isbn = "0878499695",

series = "Materials Science Forum",

publisher = "Trans Tech Publications Ltd",

pages = "287--293",

booktitle = "Residual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7",

address = "Switzerland",

note = "7th International Conference on Residual Stresses, ICRS-7 ; Conference date: 14-06-2004 Through 17-06-2004",

}

Almer, JD, Swift, GA, Nychka, JA, Üstündag, E & Clarke, DR 2005, In situ synchrotron measurements of oxide growth strains. in Residual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7. Materials Science Forum, vol. 490-491, Trans Tech Publications Ltd, pp. 287-293, 7th International Conference on Residual Stresses, ICRS-7, Xi'an, China, 14/06/04. https://doi.org/10.4028/0-87849-969-5.287

In situ synchrotron measurements of oxide growth strains. / Almer, Jonathan D.; Swift, Geoffrey A.; Nychka, John A. et al.
Residual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7. Trans Tech Publications Ltd, 2005. p. 287-293 (Materials Science Forum; Vol. 490-491).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - In situ synchrotron measurements of oxide growth strains

AU - Almer, Jonathan D.

AU - Swift, Geoffrey A.

AU - Nychka, John A.

AU - Üstündag, Ersan

AU - Clarke, David R.

PY - 2005

Y1 - 2005

N2 - Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal Al FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (∼80keV) xrays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of-3.7 GPa.

AB - Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal Al FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (∼80keV) xrays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of-3.7 GPa.

UR - https://www.scopus.com/pages/publications/35148818261

U2 - 10.4028/0-87849-969-5.287

DO - 10.4028/0-87849-969-5.287

M3 - Conference contribution

AN - SCOPUS:35148818261

SN - 0878499695

SN - 9780878499694

T3 - Materials Science Forum

SP - 287

EP - 293

BT - Residual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7

PB - Trans Tech Publications Ltd

T2 - 7th International Conference on Residual Stresses, ICRS-7

Y2 - 14 June 2004 through 17 June 2004

ER -

In situ synchrotron measurements of oxide growth strains

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