Identifying transformer incipient events for maintaining distribution system reliability

K. L. Butler-Purry, M. Bagriyanik

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

17 Citations (Scopus)

Abstract

This paper presents the time domain and time-frequency domain analysis results of incipient events in single-phase distribution transformers. This analysis aids in the development of an automatic detection method for internal incipient faults in the transformers. The detection method can provide information to predict failures ahead of time so that the necessary corrective actions are taken to prevent outages and reduce down times. The analyzed data was obtained from simulations and experiments. Time-frequency analysis was performed using discrete wavelet transform (DWT). The obtained results are discussed.

Original languageEnglish
Title of host publicationProceedings of the 36th Annual Hawaii International Conference on System Sciences, HICSS 2003
EditorsRalph H. Sprague
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0769518745, 9780769518749
DOIs
Publication statusPublished - 2003
Event36th Annual Hawaii International Conference on System Sciences, HICSS 2003 - Big Island, United States
Duration: 6 Jan 20039 Jan 2003

Publication series

NameProceedings of the 36th Annual Hawaii International Conference on System Sciences, HICSS 2003

Conference

Conference36th Annual Hawaii International Conference on System Sciences, HICSS 2003
Country/TerritoryUnited States
CityBig Island
Period6/01/039/01/03

Bibliographical note

Publisher Copyright:
© 2003 IEEE.

Keywords

  • discrete wavelet transform
  • incipient fault
  • Transformer

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