High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

A. Oral; R. A. Grimble; H. Ö Özer; J. B. Pethica

doi:10.1063/1.1593786

High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

A. Oral^*, R. A. Grimble, H. Ö Özer, J. B. Pethica

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

43 Citations (Scopus)

Abstract

A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions.

Original language	English
Pages (from-to)	3656-3663
Number of pages	8
Journal	Review of Scientific Instruments
Volume	74
Issue number	8
DOIs	https://doi.org/10.1063/1.1593786
Publication status	Published - Aug 2003
Externally published	Yes

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10.1063/1.1593786

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title = "High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy",

abstract = "A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions.",

author = "A. Oral and Grimble, {R. A.} and {\"O}zer, {H. {\"O}} and Pethica, {J. B.}",

year = "2003",

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doi = "10.1063/1.1593786",

language = "English",

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journal = "Review of Scientific Instruments",

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High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy. / Oral, A.; Grimble, R. A.; Özer, H. Ö et al.
In: Review of Scientific Instruments, Vol. 74, No. 8, 08.2003, p. 3656-3663.

Research output: Contribution to journal › Article › peer-review

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AU - Oral, A.

AU - Grimble, R. A.

AU - Özer, H. Ö

AU - Pethica, J. B.

PY - 2003/8

Y1 - 2003/8

N2 - A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions.

AB - A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions.

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JF - Review of Scientific Instruments

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High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

Abstract

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