Abstract
In this paper, total ionizing dose (TID) induced effects on OLED devices are investigated. Two fresh and one electrically stressed OLEDs were irradiated with Cobalt-60. Current-Voltage (I-V) and illumination measurements at different operation conditions were performed. The changes in both I-V characteristics and intensity behavior showcase the degree of immunity towards irradiation, making these devices particularly appealing for space applications.
Original language | English |
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Title of host publication | 2021 13th International Conference on Electrical and Electronics Engineering, ELECO 2021 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 531-534 |
Number of pages | 4 |
ISBN (Electronic) | 9786050114379 |
DOIs | |
Publication status | Published - 2021 |
Event | 13th International Conference on Electrical and Electronics Engineering, ELECO 2021 - Virtual, Bursa, Turkey Duration: 25 Nov 2021 → 27 Nov 2021 |
Publication series
Name | 2021 13th International Conference on Electrical and Electronics Engineering, ELECO 2021 |
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Conference
Conference | 13th International Conference on Electrical and Electronics Engineering, ELECO 2021 |
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Country/Territory | Turkey |
City | Virtual, Bursa |
Period | 25/11/21 → 27/11/21 |
Bibliographical note
Publisher Copyright:© 2021 Chamber of Turkish Electrical Engineers.
Keywords
- degradation
- irradiation
- OLED
- TID