Abstract
In this paper, total ionizing dose (TID) induced effects on OLED devices are investigated. Two fresh and one electrically stressed OLEDs were irradiated with Cobalt-60. Current-Voltage (I-V) and illumination measurements at different operation conditions were performed. The changes in both I-V characteristics and intensity behavior showcase the degree of immunity towards irradiation, making these devices particularly appealing for space applications.
| Original language | English |
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| Title of host publication | 2021 13th International Conference on Electrical and Electronics Engineering, ELECO 2021 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 531-534 |
| Number of pages | 4 |
| ISBN (Electronic) | 9786050114379 |
| DOIs | |
| Publication status | Published - 2021 |
| Event | 13th International Conference on Electrical and Electronics Engineering, ELECO 2021 - Virtual, Bursa, Turkey Duration: 25 Nov 2021 → 27 Nov 2021 |
Publication series
| Name | 2021 13th International Conference on Electrical and Electronics Engineering, ELECO 2021 |
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Conference
| Conference | 13th International Conference on Electrical and Electronics Engineering, ELECO 2021 |
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| Country/Territory | Turkey |
| City | Virtual, Bursa |
| Period | 25/11/21 → 27/11/21 |
Bibliographical note
Publisher Copyright:© 2021 Chamber of Turkish Electrical Engineers.
Funding
This work was sponsored by the Technological Research Council of Turkey under the project TUBITAK 1001 215E080. The authors also thank the Turkish Atomic Energy Authority.
| Funders | Funder number |
|---|---|
| Technological Research Council of Turkey | 1001 215E080 |
Keywords
- degradation
- irradiation
- OLED
- TID