Face Liveness Detection Competition (LivDet-Face)-2021

Sandip Purnapatra*, Nic Smalt, Keivan Bahmani, Priyanka Das, David Yambay, Amir Mohammadi, Anjith George, Thirimachos Bourlai, Sebastien Marcel, Stephanie Schuckers, Meiling Fang, Naser Damer, Fadi Boutros, Arjan Kuijper, Alperen Kantarci, Basar Demir, Zafer Yildiz, Zabi Ghafoory, Hasan Dertli, Hazim Kemal EkenelSon Vu, Vassilis Christophides, Liang Dashuang, Zhang Guanghao, Hao Zhanlong, Liu Junfu, Jin Yufeng, Samo Liu, Samuel Huang, Salieri Kuei, Jag Mohan Singh, Raghavendra Ramachandra

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

17 Citations (Scopus)

Abstract

Liveness Detection (LivDet)-Face is an international competition series open to academia and industry. The competition's objective is to assess and report state-of-The-Art in liveness / Presentation Attack Detection (PAD) for face recognition. Impersonation and presentation of false samples to the sensors can be classified as presentation attacks and the ability for the sensors to detect such attempts is known as PAD. LivDet-Face 2021 ∗ will be the first edition of the face liveness competition. This competition serves as an important benchmark in face presentation attack detection, offering (a) an independent assessment of the current state of the art in face PAD, and (b) a common evaluation protocol, availability of Presentation Attack Instruments (PAI) and live face image dataset through the Biometric Evaluation and Testing (BEAT) platform. The competition can be easily followed by researchers after it is closed, in a platform in which participants can compare their solutions against the LivDet-Face winners.

Original languageEnglish
Title of host publication2021 IEEE International Joint Conference on Biometrics, IJCB 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665437806
DOIs
Publication statusPublished - 4 Aug 2021
Externally publishedYes
Event2021 IEEE International Joint Conference on Biometrics, IJCB 2021 - Shenzhen, China
Duration: 4 Aug 20217 Aug 2021

Publication series

Name2021 IEEE International Joint Conference on Biometrics, IJCB 2021

Conference

Conference2021 IEEE International Joint Conference on Biometrics, IJCB 2021
Country/TerritoryChina
CityShenzhen
Period4/08/217/08/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

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