Abstract
Fault tolerance is a critical aspect of modern electronic systems, particularly in environments like space, aviation, and automotive, where reliability is paramount. This paper examines the fault tolerance approaches in RISC-V architectures. Techniques such as spatial, temporal, and information redundancy are reviewed, with a focus on their integration into RISC-V-based systems. Comparative analysis of single-core and multi-core redundancy, including modular and heterogeneous approaches, demonstrates their impact on performance, energy efficiency, and cost. Testing methods ranging from simulation to real-world radiation exposure are evaluated. Finally, insights into future research opportunities are presented to guide the development of more robust and efficient fault-tolerant systems.
| Original language | English |
|---|---|
| Title of host publication | 2025 12th International Conference on Electrical and Electronics Engineering, ICEEE 2025 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 19-23 |
| Number of pages | 5 |
| ISBN (Electronic) | 9798331598440 |
| DOIs | |
| Publication status | Published - 2025 |
| Event | 12th International Conference on Electrical and Electronics Engineering, ICEEE 2025 - Istanbul, Turkey Duration: 24 Sept 2025 → 26 Sept 2025 |
Publication series
| Name | 2025 12th International Conference on Electrical and Electronics Engineering, ICEEE 2025 |
|---|
Conference
| Conference | 12th International Conference on Electrical and Electronics Engineering, ICEEE 2025 |
|---|---|
| Country/Territory | Turkey |
| City | Istanbul |
| Period | 24/09/25 → 26/09/25 |
Bibliographical note
Publisher Copyright:© 2025 IEEE.
Keywords
- DMR
- ECC
- Fault Tolerance
- MBU
- ODMR
- Redundancy
- SEU
- TMR
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