TY - JOUR
T1 - Experimental evaluation of the deadtime phenomenon for GM detector
T2 - deadtime dependence on operating voltages
AU - Almutairi, Bader
AU - Alam, Syed
AU - Akyurek, Tayfun
AU - Goodwin, Cameron S.
AU - Usman, Shoaib
N1 - Publisher Copyright:
© 2020, The Author(s).
PY - 2020/12
Y1 - 2020/12
N2 - A detailed analysis of Geiger Mueller counter deadtime dependence on operating voltage is presented in the manuscript using four pairs of radiation sources. Based on two-source method, detector deadtime is calculated for a wide range of operating voltages which revealed a peculiar relationship between the operating voltage and the detector deadtime. In the low voltage range, a distinct drop in deadtime was observed where deadtime reached a value as low as a few microseconds (22 µs for 204Tl, 26 µs for 137Cs, 9 µs for 22Na). This sharp drop in the deadtime is possibly due to reduced recombination with increasing voltage. After the lowest point, the deadtime generally increased rapidly to reach a maximum (292 µs for 204Tl, 277 µs for 137Cs, 258 µs for 22Na). This rapid increase in the deadtime is mainly due to the on-set of charge multiplication. After the maximum deadtime values, there was an exponential decrease in the deadtime reaching an asymptotic low where the manufacturer recommended voltage for operation falls. This pattern of deadtime voltage dependence was repeated for all sources tested with the exception of 54Mn. Low count rates leading to a negative deadtime suggested poor statistical nature of the data collected for 54Mn and the data while being presented here is not used for any inference.
AB - A detailed analysis of Geiger Mueller counter deadtime dependence on operating voltage is presented in the manuscript using four pairs of radiation sources. Based on two-source method, detector deadtime is calculated for a wide range of operating voltages which revealed a peculiar relationship between the operating voltage and the detector deadtime. In the low voltage range, a distinct drop in deadtime was observed where deadtime reached a value as low as a few microseconds (22 µs for 204Tl, 26 µs for 137Cs, 9 µs for 22Na). This sharp drop in the deadtime is possibly due to reduced recombination with increasing voltage. After the lowest point, the deadtime generally increased rapidly to reach a maximum (292 µs for 204Tl, 277 µs for 137Cs, 258 µs for 22Na). This rapid increase in the deadtime is mainly due to the on-set of charge multiplication. After the maximum deadtime values, there was an exponential decrease in the deadtime reaching an asymptotic low where the manufacturer recommended voltage for operation falls. This pattern of deadtime voltage dependence was repeated for all sources tested with the exception of 54Mn. Low count rates leading to a negative deadtime suggested poor statistical nature of the data collected for 54Mn and the data while being presented here is not used for any inference.
UR - http://www.scopus.com/inward/record.url?scp=85096121276&partnerID=8YFLogxK
U2 - 10.1038/s41598-020-75310-3
DO - 10.1038/s41598-020-75310-3
M3 - Article
C2 - 33203933
AN - SCOPUS:85096121276
SN - 2045-2322
VL - 10
JO - Scientific Reports
JF - Scientific Reports
IS - 1
M1 - 19955
ER -