Abstract
Machined Zr52.5Ti5Cu17.9Ni14.6Al10 bulk metallic glass (BMG) chips were characterized using high resolution electron microscopy. Compared to conventional processing techniques, machining produces very high heating/cooling, and deformation rates. It is therefore of interest to compare structural changes in machining chips with those produced by conventional processing. Large (∼1 μm) crystalline grain, residual amorphous region, and phase separation in the amorphous-crystalline transition region were detected in bright field TEM images. Three equilibrium phases, Zr2Cu, ZrAl2, and Zr2Ni, which have been identified in samples undergoing conventional annealing, were revealed from selected area electron diffraction patterns of the chips. High magnification TEM micrographs showed nanocrystallites, about 10 nm in size, in the amorphous-crystalline transition region.
Original language | English |
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Pages (from-to) | 2220-2223 |
Number of pages | 4 |
Journal | Journal of Non-Crystalline Solids |
Volume | 355 |
Issue number | 45-47 |
DOIs | |
Publication status | Published - 1 Nov 2009 |
Funding
The author thanks to Dr. Albert J. Shih, Dr. Ronald O. Scattergood and Dr. Lawrance F. Allard for the useful comments on the manuscript. A portion of this research was sponsored by the Heavy Vehicle Propulsion Systems Materials Program, Office of Transportation Technologies, US Department of Energy and by the Assistant Secretary for Energy Efficiency and Renewable Energy, Office of Transportation Technologies, as part of the High Temperature Materials Laboratory User Program, Oak Ridge National Laboratory, managed by UT-Battelle, LLC for the US Department of Energy under Contract No. DE-AC05-00OR22725.
Funders | Funder number |
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Office of Transportation Technologies | |
US Department of Energy | |
UT-Battelle | |
Office of Energy Efficiency and Renewable Energy | |
Oak Ridge National Laboratory |
Keywords
- Amorphous metals, metallic glasses
- Crystallization
- Liquid alloys and liquid metals
- Microcrystallinity
- Nanocrystals
- TEM/STEM