Electro-optical measurements of ultrashort 45 MeV electron beam bunch

D. Nikas; V. Castillo; L. Kowalski; R. Larsen; D. M. Lazarus; C. Ozben; Y. K. Semertzidis; T. Tsang; T. Srinivasan-Rao

doi:10.1142/S0217751X01009168

Electro-optical measurements of ultrashort 45 MeV electron beam bunch

D. Nikas^*, V. Castillo, L. Kowalski, R. Larsen, D. M. Lazarus, C. Ozben, Y. K. Semertzidis, T. Tsang, T. Srinivasan-Rao

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the optical beam path distance from the electron beam. The risetime of the signal was bandwidth limited by our detection system to ∼ 70 ps. An EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. The EO technique may be ideal for the measurement of bunch structure with femtosecond resolution of relativistic charged particle beam bunches.

Original language	English
Pages (from-to)	1150-1152
Number of pages	3
Journal	International Journal of Modern Physics A
Volume	16
Issue number	SUPPL. 1C
DOIs	https://doi.org/10.1142/S0217751X01009168
Publication status	Published - 2001
Externally published	Yes

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title = "Electro-optical measurements of ultrashort 45 MeV electron beam bunch",

abstract = "We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the optical beam path distance from the electron beam. The risetime of the signal was bandwidth limited by our detection system to ∼ 70 ps. An EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. The EO technique may be ideal for the measurement of bunch structure with femtosecond resolution of relativistic charged particle beam bunches.",

author = "D. Nikas and V. Castillo and L. Kowalski and R. Larsen and Lazarus, {D. M.} and C. Ozben and Semertzidis, {Y. K.} and T. Tsang and T. Srinivasan-Rao",

year = "2001",

doi = "10.1142/S0217751X01009168",

language = "English",

volume = "16",

pages = "1150--1152",

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T1 - Electro-optical measurements of ultrashort 45 MeV electron beam bunch

AU - Nikas, D.

AU - Castillo, V.

AU - Kowalski, L.

AU - Larsen, R.

AU - Lazarus, D. M.

AU - Ozben, C.

AU - Semertzidis, Y. K.

AU - Tsang, T.

AU - Srinivasan-Rao, T.

PY - 2001

Y1 - 2001

N2 - We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the optical beam path distance from the electron beam. The risetime of the signal was bandwidth limited by our detection system to ∼ 70 ps. An EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. The EO technique may be ideal for the measurement of bunch structure with femtosecond resolution of relativistic charged particle beam bunches.

AB - We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the optical beam path distance from the electron beam. The risetime of the signal was bandwidth limited by our detection system to ∼ 70 ps. An EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. The EO technique may be ideal for the measurement of bunch structure with femtosecond resolution of relativistic charged particle beam bunches.

UR - http://www.scopus.com/inward/record.url?scp=0035557883&partnerID=8YFLogxK

U2 - 10.1142/S0217751X01009168

DO - 10.1142/S0217751X01009168

M3 - Article

AN - SCOPUS:0035557883

SN - 0217-751X

VL - 16

SP - 1150

EP - 1152

JO - International Journal of Modern Physics A

JF - International Journal of Modern Physics A

IS - SUPPL. 1C

ER -

Electro-optical measurements of ultrashort 45 MeV electron beam bunch

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