Electro-optical measurements of picosecond bunch length of a 45 MeV electron beam

T. Tsang*, V. Castillo, R. Larsen, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, T. Srinivasan-Rao, L. Kowalski

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

We have measured the temporal duration of 45 MeV picosecond electron beam bunches using a noninvasive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with distance from the electron beam. The rise time of the temporal signal was limited by our detection system to ∼70 ps. The EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. It has a distinctively long decay time constant and signal polarity opposite to that due to the field induced by the electron beam. The electro-optical technique may be ideal for the measurement of bunch length of femtosecond, relativistic, high energy, charged, particle beams.

Original languageEnglish
Pages (from-to)4921-4926
Number of pages6
JournalJournal of Applied Physics
Volume89
Issue number9
DOIs
Publication statusPublished - 1 May 2001
Externally publishedYes

Fingerprint

Dive into the research topics of 'Electro-optical measurements of picosecond bunch length of a 45 MeV electron beam'. Together they form a unique fingerprint.

Cite this