Effects of ZnO varistor degradation on the overvoltage protection mechanism of electronic boards

H. Yadavari, B. Sal, M. Altun, E. N. Erturk, B. Ocak

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

In this study, we investigate degradation of ZnO varistors and their effects on electronic boards. We propose a model showing how the varistor clamping voltage Vv changes by time for different stress levels. To evaluate the model, we exploit measured experimental test data as well as field return data with over 1000 board failures. Varistors in-use are usually subjected to a long-term AC or DC voltage stress and surge which may lead to degradation of the varistors with an increase of the Vv parameters. We show that degraded varistors cause dramatic failures of other components in the same power block of the electronic board. We perform experiments on varistor degradation and failing mechanisms by applying 8/20 us, 2 ms and accelerated AC voltage test methodologies. We also simulate the relation of the varistor degradation with other components in time domain.

Original languageEnglish
Title of host publicationSafety and Reliability of Complex Engineered Systems - Proceedings of the 25th European Safety and Reliability Conference, ESREL 2015
EditorsLuca Podofillini, Bruno Sudret, Božidar Stojadinović, Enrico Zio, Wolfgang Kröger
PublisherCRC Press/Balkema
Pages2153-2160
Number of pages8
ISBN (Print)9781138028791
DOIs
Publication statusPublished - 2015
Event25th European Safety and Reliability Conference, ESREL 2015 - Zurich, Swaziland
Duration: 7 Sept 201510 Sept 2015

Publication series

NameSafety and Reliability of Complex Engineered Systems - Proceedings of the 25th European Safety and Reliability Conference, ESREL 2015

Conference

Conference25th European Safety and Reliability Conference, ESREL 2015
Country/TerritorySwaziland
CityZurich
Period7/09/1510/09/15

Bibliographical note

Publisher Copyright:
© 2015 Taylor & Francis Group, London.

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