Effect of temperature and film thickness on residual stress and texture of Rr2O3 buffer layers for YBCO coated conductor

Lutfi Arda*, S. Ataoglu, O. Bulut

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Re2O3 (Re = Er, Gd, Ho, Y and Yb) was prepared by sol-gel synthesis using metal-organic precursors. Residual stress and microstructure in the Re2O3 buffer layers were investigated as a function of temperature and film thickness. Textured Re 2O3 buffer layers were grown on biaxially textured-Ni (100) substrates using chemical solution deposition. Films were annealed at 1150°C under a flowing 4 % H2 - Ar gas. X-ray diffraction of the buffers showed strong out-of-plane orientation on Ni tape. Residual stress in various thicknesses of buffer layers was calculated. The surface morphologies and microstructure of all samples were characterized using SEM and AFM. &copy: 2009 IEEE.

Original languageEnglish
Article number5153144
Pages (from-to)3291-3294
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume19
Issue number3
DOIs
Publication statusPublished - Jun 2009

Funding

Manuscript received August 24, 2008. First published June 30, 2009; current version published July 15, 2009. The present work was supported by the Research Fund of Bahcesehir University. L. Arda is with the Bahcesehir University, Arts and Sciences Faculty, Be-siktas, 34349 Istanbul, Turkey (e-mail: lutfi.arda@bahcesehir.edu.tr). S. Ataoglu and O. Bulut are with the Istanbul Technical University, Faculty of Civil Engineering, 34469 Istanbul, Turkey (e-mail: ataoglu@itu.edu.tr; bu-luto@itu.edu.tr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org Digital Object Identifier 10.1109/TASC.2009.2017882

FundersFunder number
Bahcesehir University

    Keywords

    • Buffer layers
    • Chemical solution deposition
    • Re-oxide
    • YBCO

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