Abstract
Re2O3 (Re = Er, Gd, Ho, Y and Yb) was prepared by sol-gel synthesis using metal-organic precursors. Residual stress and microstructure in the Re2O3 buffer layers were investigated as a function of temperature and film thickness. Textured Re 2O3 buffer layers were grown on biaxially textured-Ni (100) substrates using chemical solution deposition. Films were annealed at 1150°C under a flowing 4 % H2 - Ar gas. X-ray diffraction of the buffers showed strong out-of-plane orientation on Ni tape. Residual stress in various thicknesses of buffer layers was calculated. The surface morphologies and microstructure of all samples were characterized using SEM and AFM. ©: 2009 IEEE.
Original language | English |
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Article number | 5153144 |
Pages (from-to) | 3291-3294 |
Number of pages | 4 |
Journal | IEEE Transactions on Applied Superconductivity |
Volume | 19 |
Issue number | 3 |
DOIs | |
Publication status | Published - Jun 2009 |
Funding
Manuscript received August 24, 2008. First published June 30, 2009; current version published July 15, 2009. The present work was supported by the Research Fund of Bahcesehir University. L. Arda is with the Bahcesehir University, Arts and Sciences Faculty, Be-siktas, 34349 Istanbul, Turkey (e-mail: [email protected]). S. Ataoglu and O. Bulut are with the Istanbul Technical University, Faculty of Civil Engineering, 34469 Istanbul, Turkey (e-mail: [email protected]; [email protected]). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org Digital Object Identifier 10.1109/TASC.2009.2017882
Funders | Funder number |
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Bahcesehir University |
Keywords
- Buffer layers
- Chemical solution deposition
- Re-oxide
- YBCO