Abstract
Pure and Aluminum doped zinc oxide (Al:ZnO) film samples were deposited by the sol–gel dip-coating technique for understand influence of Al concentration on the films crystallization, electrical conductivity and optical transparency. Surface morphology of the film with hexagonal wurtize crystalline structure and high c-axis orientation (in XRD analysis) displayed nanospherical particals (in SEM images). The surface roughness and average grain size increased with Al amount rise in the Al/Zn ratio. The film displayed high transparency (~90%) between 300 and 800 nm for pure and 1, 3 at.% Al concentration levels. The energy band gap, refractive index, and extinction coefficient were affected slightly due to the increasing Al concentration and optical parameters attain gently a maximum value at 3 at.% Al content.
Original language | English |
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Article number | 128000 |
Journal | Materials Letters |
Volume | 274 |
DOIs | |
Publication status | Published - 1 Sept 2020 |
Bibliographical note
Publisher Copyright:© 2020 Elsevier B.V.
Funding
This study was financially supported by Istanbul Technical University (ITU) Scientific Research Projects Foundation (BAP) with Project No: MDK-2019-41978 for Ph. D. Thesis in Istanbul, Turkey.
Funders | Funder number |
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Scientific Research Projects Foundation | |
British Association for Psychopharmacology | |
Istanbul Teknik Üniversitesi | |
Bilimsel Araştırma Projeleri Birimi, İstanbul Teknik Üniversitesi | MDK-2019-41978 |
Keywords
- Al:ZnO
- Dip coating
- Sol–gel
- Thin film