Dynamical diffraction peak splitting in time-of-flight neutron diffraction

E. Üstündag; R. A. Karnesky; M. R. Daymond; I. C. Noyan

doi:10.1063/1.2402220

Dynamical diffraction peak splitting in time-of-flight neutron diffraction

E. Üstündag^*, R. A. Karnesky, M. R. Daymond, I. C. Noyan

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

Time-of-flight neutron diffraction data from 20 and 0.7 mm thick perfect Si single crystal samples, which exhibit dynamical diffraction effects associated with finite crystal size, are presented. This effect is caused by constructive interference occurring solely from thin layers bounded by the front (entry) and back (exit) surfaces of the sample with no scattering originating from the layers in between, resulting in two distinct peaks observed for each reflection. If the sample is thin and/or the instrument resolution is insufficient, these two peaks can convolve and cause peak shape aberrations which can lead to significant errors in the strain and peak-broadening parameters obtained from a kinematical diffraction analysis.

Original language	English
Article number	233515
Journal	Applied Physics Letters
Volume	89
Issue number	23
DOIs	https://doi.org/10.1063/1.2402220
Publication status	Published - 2006
Externally published	Yes

Funding

Funding was provided by the National Science Foundation (NSF) grants DMR-9985264 and IMR-MIP DMR-0412074. The authors acknowledge help from Dr. B. Clausen at the Los Alamos Neutron Science Center which is supported by the U.S. Department of Energy under Contract No. W-7405-ENG-36. The ENGIN-X diffractometer is located on the ISIS Pulsed Neutron Facility, Rutherford Appleton Laboratory, UK, where author M.R.D. was a staff member during the experiments.

Funders	Funder number
National Science Foundation	DMR-9985264, IMR-MIP DMR-0412074
U.S. Department of Energy

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AU - Üstündag, E.

AU - Karnesky, R. A.

AU - Daymond, M. R.

AU - Noyan, I. C.

PY - 2006

Y1 - 2006

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AB - Time-of-flight neutron diffraction data from 20 and 0.7 mm thick perfect Si single crystal samples, which exhibit dynamical diffraction effects associated with finite crystal size, are presented. This effect is caused by constructive interference occurring solely from thin layers bounded by the front (entry) and back (exit) surfaces of the sample with no scattering originating from the layers in between, resulting in two distinct peaks observed for each reflection. If the sample is thin and/or the instrument resolution is insufficient, these two peaks can convolve and cause peak shape aberrations which can lead to significant errors in the strain and peak-broadening parameters obtained from a kinematical diffraction analysis.

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ER -

Dynamical diffraction peak splitting in time-of-flight neutron diffraction

Abstract

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