Dissipation imaging with low amplitude off-resonance atomic force microscopy

H. Özgür Özer; Simon J. O'Brien; Andrew Norris; John E. Sader; John B. Pethica

doi:10.1143/JJAP.44.5325

Dissipation imaging with low amplitude off-resonance atomic force microscopy

H. Özgür Özer^*, Simon J. O'Brien, Andrew Norris, John E. Sader, John B. Pethica

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

A small amplitude non-contact atomic force microscope/scanning tunnelling microscope (nc-AFM/STM) is used to study dissipative interactions at atomic resolution on Cu(100) and Si(111) surfaces. For Cu(100) atomic resolution images of phase contrast are obtained, showing energy dissipation as high as 100meV/cycle at each atomic site during constant tunnel current scans. In contrast, the Si(111) 7 × 7 surface usually did not exhibit significant phase contrast during normal STM operating conditions. However, when the driving oscillation frequency was set to a sub-harmonic of the lever resonant frequency, atomic contrast in phase could be readily observed. We believe this harmonic coupling is due to the nonlinearity of the tipsample interaction, and at these frequencies part of the energy is dissipated via the lever Q.

Original language	English
Pages (from-to)	5325-5327
Number of pages	3
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	44
Issue number	7 B
DOIs	https://doi.org/10.1143/JJAP.44.5325
Publication status	Published - 26 Jul 2005
Externally published	Yes

Keywords

Atomic force microscopy
Dissipation
Force gradient
Harmonic coupling
Low amplitude
Phase
Scanning tunneling microscopy

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10.1143/JJAP.44.5325

Cite this

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title = "Dissipation imaging with low amplitude off-resonance atomic force microscopy",

abstract = "A small amplitude non-contact atomic force microscope/scanning tunnelling microscope (nc-AFM/STM) is used to study dissipative interactions at atomic resolution on Cu(100) and Si(111) surfaces. For Cu(100) atomic resolution images of phase contrast are obtained, showing energy dissipation as high as 100meV/cycle at each atomic site during constant tunnel current scans. In contrast, the Si(111) 7 × 7 surface usually did not exhibit significant phase contrast during normal STM operating conditions. However, when the driving oscillation frequency was set to a sub-harmonic of the lever resonant frequency, atomic contrast in phase could be readily observed. We believe this harmonic coupling is due to the nonlinearity of the tipsample interaction, and at these frequencies part of the energy is dissipated via the lever Q.",

keywords = "Atomic force microscopy, Dissipation, Force gradient, Harmonic coupling, Low amplitude, Phase, Scanning tunneling microscopy",

author = "{\"O}zer, {H. {\"O}zg{\"u}r} and O'Brien, {Simon J.} and Andrew Norris and Sader, {John E.} and Pethica, {John B.}",

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T1 - Dissipation imaging with low amplitude off-resonance atomic force microscopy

AU - Özer, H. Özgür

AU - O'Brien, Simon J.

AU - Norris, Andrew

AU - Sader, John E.

AU - Pethica, John B.

PY - 2005/7/26

Y1 - 2005/7/26

N2 - A small amplitude non-contact atomic force microscope/scanning tunnelling microscope (nc-AFM/STM) is used to study dissipative interactions at atomic resolution on Cu(100) and Si(111) surfaces. For Cu(100) atomic resolution images of phase contrast are obtained, showing energy dissipation as high as 100meV/cycle at each atomic site during constant tunnel current scans. In contrast, the Si(111) 7 × 7 surface usually did not exhibit significant phase contrast during normal STM operating conditions. However, when the driving oscillation frequency was set to a sub-harmonic of the lever resonant frequency, atomic contrast in phase could be readily observed. We believe this harmonic coupling is due to the nonlinearity of the tipsample interaction, and at these frequencies part of the energy is dissipated via the lever Q.

AB - A small amplitude non-contact atomic force microscope/scanning tunnelling microscope (nc-AFM/STM) is used to study dissipative interactions at atomic resolution on Cu(100) and Si(111) surfaces. For Cu(100) atomic resolution images of phase contrast are obtained, showing energy dissipation as high as 100meV/cycle at each atomic site during constant tunnel current scans. In contrast, the Si(111) 7 × 7 surface usually did not exhibit significant phase contrast during normal STM operating conditions. However, when the driving oscillation frequency was set to a sub-harmonic of the lever resonant frequency, atomic contrast in phase could be readily observed. We believe this harmonic coupling is due to the nonlinearity of the tipsample interaction, and at these frequencies part of the energy is dissipated via the lever Q.

KW - Atomic force microscopy

KW - Dissipation

KW - Force gradient

KW - Harmonic coupling

KW - Low amplitude

KW - Phase

KW - Scanning tunneling microscopy

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JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 7 B

ER -

Dissipation imaging with low amplitude off-resonance atomic force microscopy

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Keywords

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