@inproceedings{8ba54a3cc7cd4e68ae4259e39ea57d42,
title = "Dione: An integrated measurement and defect prediction solution",
abstract = "We present an integrated measurement and defect prediction tool: Dione. Our tool enables organizations to measure, monitor, and control product quality through learning based defect prediction. Similar existing tools either provide data collection and analytics, or work just as a prediction engine. Therefore, companies need to deal with multiple tools with incompatible interfaces in order to deploy a complete measurement and prediction solution. Dione provides a fully integrated solution where data extraction, defect prediction and reporting steps fit seamlessly. In this paper, we present the major functionality and architectural elements of Dione followed by an overview of our demonstration.",
keywords = "measurement, software defect prediction, software tool",
author = "Bora Caglayan and Misirli, {Ayse Tosun} and Gul Calikli and Ayse Bener and Turgay Aytac and Burak Turhan",
year = "2012",
doi = "10.1145/2393596.2393619",
language = "English",
isbn = "9781450316149",
series = "Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering, FSE 2012",
booktitle = "Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering, FSE 2012",
note = "20th ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE 2012 ; Conference date: 11-11-2012 Through 16-11-2012",
}