Different strokes for different folks: A case study on software metrics for different defect categories

Ayse Tosun Misirli, Bora Caglayan, Andriy V. Miranskyy, Ayse Bener, Nuzio Ruffolo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

13 Citations (Scopus)

Abstract

Defect prediction has been evolved with variety of metric sets, and defect types. Researchers found code, churn, and network metrics as significant indicators of defects. However, all metric sets may not be informative for all defect categories such that only one metric type may represent majority of a defect category. Our previous study showed that defect category sensitive prediction models are more successful than general models, since each category has different characteristics in terms of metrics. We extend our previous work, and propose specialized prediction models using churn, code, and network metrics with respect to three defect categories. Results show that churn metrics are the best for predicting all defects. The strength of correlation for code and network metrics varies with defect category: Network metrics have higher correlations than code metrics for defects reported during functional testing and in the field, and vice versa for defects reported during system testing.

Original languageEnglish
Title of host publicationWETSoM'11 - Proceedings of the 2nd International Workshop on Emerging Trends in Software Metrics, Co-located with ICSE 2011
Pages45-51
Number of pages7
DOIs
Publication statusPublished - 2011
Externally publishedYes
Event2nd International Workshop on Emerging Trends in Software Metrics, WETSoM 2011, Co-located with 33rd ACM/IEEE International Conference on Software Engineering, ICSE 2011 - Waikiki, Honolulu, HI, United States
Duration: 24 May 201124 May 2011

Publication series

NameProceedings - International Conference on Software Engineering
ISSN (Print)0270-5257

Conference

Conference2nd International Workshop on Emerging Trends in Software Metrics, WETSoM 2011, Co-located with 33rd ACM/IEEE International Conference on Software Engineering, ICSE 2011
Country/TerritoryUnited States
CityWaikiki, Honolulu, HI
Period24/05/1124/05/11

Keywords

  • churn metrics
  • network metrics
  • software defect prediction
  • static code metrics

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