TY - GEN
T1 - Dişbükey zarf tekniǧine dayali eǧim kirinimi modelinin çoklu kirinim geometrisinde kullanilmasi
AU - Tabakcioǧlu, Mehmet Bariş
AU - Cansiz, Ahmet
PY - 2010
Y1 - 2010
N2 - Calculation of relative path loss of electromagnetic wave in multiple diffraction geometries is important. In this respect, many diffraction models have been introduced. There is a trade-off between computation time and accuracy of estimated field strength. Some models have higher computation time with lower accuracy, or vice versa. In this study, Slope UTD with Convex Hull (S-UTD-CH), optimum model for accuracy and computation time, is introduced briefly, and simulation results are given. S-UTD-CH model is based on slope diffraction (S-UTD) including slope terms of UTD, and convex hull (CH) method. It is observed in simulation how polarization types, interior wedge angle, conductivity and relative permittivity of wedge affects the relative path loss. Moreover, comparative results of different models with respect to accuracy and computational time for a given profile are presented in this study.
AB - Calculation of relative path loss of electromagnetic wave in multiple diffraction geometries is important. In this respect, many diffraction models have been introduced. There is a trade-off between computation time and accuracy of estimated field strength. Some models have higher computation time with lower accuracy, or vice versa. In this study, Slope UTD with Convex Hull (S-UTD-CH), optimum model for accuracy and computation time, is introduced briefly, and simulation results are given. S-UTD-CH model is based on slope diffraction (S-UTD) including slope terms of UTD, and convex hull (CH) method. It is observed in simulation how polarization types, interior wedge angle, conductivity and relative permittivity of wedge affects the relative path loss. Moreover, comparative results of different models with respect to accuracy and computational time for a given profile are presented in this study.
UR - http://www.scopus.com/inward/record.url?scp=79951596673&partnerID=8YFLogxK
M3 - Konferans katkısı
AN - SCOPUS:79951596673
SN - 9781424495887
T3 - 2010 National Conference on Electrical, Electronics and Computer Engineering, ELECO 2010
SP - 438
EP - 442
BT - 2010 National Conference on Electrical, Electronics and Computer Engineering, ELECO 2010
T2 - 2010 7th National Conference on Electrical, Electronics and Computer Engineering, ELECO 2010
Y2 - 2 December 2010 through 5 December 2010
ER -