TY - JOUR
T1 - Development of extraction techniques for dielectric constant from free-space measured S-parameters between 50 and 170 GHz
AU - Ozturk, Turgut
AU - Elhawil, Amna
AU - Uluer, İhsan
AU - Guneser, Muhammet Tahir
N1 - Publisher Copyright:
© 2017, Springer Science+Business Media New York.
PY - 2017/8/1
Y1 - 2017/8/1
N2 - This paper is a comprehensive study on Newton–Raphson technique used in millimeter wave frequencies for material characterization. Various algorithms are used for extracting the complex permittivity of a material from measured S-parameters. Efficiency of the methods depends on the initial guess and the accuracy of measured S-parameters for each thickness and frequency band. In this paper, we suggest the initial-value estimation method that helps to estimate a proper value for starting the algorithm. Moreover, an alternative extraction process is modelled that does not require new measured S-parameters or extracting process for each frequency band and thickness with a composed database. The estimation process is conducted partially as V (50–75 GHz), W (75–110 GHz), and D (110–170 GHz) frequency bands.
AB - This paper is a comprehensive study on Newton–Raphson technique used in millimeter wave frequencies for material characterization. Various algorithms are used for extracting the complex permittivity of a material from measured S-parameters. Efficiency of the methods depends on the initial guess and the accuracy of measured S-parameters for each thickness and frequency band. In this paper, we suggest the initial-value estimation method that helps to estimate a proper value for starting the algorithm. Moreover, an alternative extraction process is modelled that does not require new measured S-parameters or extracting process for each frequency band and thickness with a composed database. The estimation process is conducted partially as V (50–75 GHz), W (75–110 GHz), and D (110–170 GHz) frequency bands.
UR - http://www.scopus.com/inward/record.url?scp=85018468349&partnerID=8YFLogxK
U2 - 10.1007/s10854-017-6953-z
DO - 10.1007/s10854-017-6953-z
M3 - Article
AN - SCOPUS:85018468349
SN - 0957-4522
VL - 28
SP - 11543
EP - 11549
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 15
ER -